公开(公告)号：US20120101619A1

公开(公告)日：2012-04-26

申请号：US13182909

申请日：2011-07-14

申请人： Hyun-cheol Lee ,  In-kap Chang ,  Seung-hoon Tong

发明人： Hyun-cheol Lee ,  In-kap Chang ,  Seung-hoon Tong

IPC分类号： G06F19/00

CPC分类号： G06Q30/0278 ,  G06Q10/20

摘要： Example embodiments relate to a measurement method of measuring lots with improved process efficiency. The measurement method may include calculating a measurement capability (indicating a degree to which members to be measured may be processed per unit time in a measurement device); allocating the measurement capability according to a processing device and a processing condition; and calculating a measurement ratio of the lots processed by the processing device and the processing condition.

摘要翻译： 示例性实施例涉及具有改进的处理效率的测量批次的测量方法。 测量方法可以包括计算测量能力（指示在测量设备中每单位时间可以处理要被测量的成员的程度）; 根据处理装置和处理条件分配测量能力; 以及计算由处理装置处理的批次和处理条件的测量比。

公开(公告)号：US08949064B2

公开(公告)日：2015-02-03

申请号：US13182909

申请日：2011-07-14

申请人： Hyun-cheol Lee ,  In-kap Chang ,  Seung-hoon Tong

发明人： Hyun-cheol Lee ,  In-kap Chang ,  Seung-hoon Tong

IPC分类号： G01D1/00 ,  G06Q30/02 ,  G06Q10/00

CPC分类号： G06Q30/0278 ,  G06Q10/20

摘要： Example embodiments relate to a measurement method of measuring lots with improved process efficiency. The measurement method may include calculating a measurement capability (indicating a degree to which members to be measured may be processed per unit time in a measurement device); allocating the measurement capability according to a processing device and a processing condition; and calculating a measurement ratio of the lots processed by the processing device and the processing condition.

摘要翻译： 示例性实施例涉及具有改进的处理效率的测量批次的测量方法。 测量方法可以包括计算测量能力（指示在测量设备中每单位时间可以处理要被测量的成员的程度）; 根据处理装置和处理条件分配测量能力; 以及计算由处理装置处理的批次和处理条件的测量比。