公开(公告)号：US11152949B2

公开(公告)日：2021-10-19

申请号：US17023358

申请日：2020-09-16

Applicant: IMEC VZW

Inventor： Annachiara Spagnolo

IPC: H03M1/46 ,  H03K3/356 ,  H03M1/80

Abstract: A pipelined successive approximation register analog-to-digital converter (2), SAR ADC, comprises a first SAR ADC stage (4); an inter-stage amplifier (6) for amplifying an analog residue from the first SAR ADC stage; and a second SAR ADC stage (8) input from the inter-stage amplifier, wherein the inter-stage amplifier (6) comprises one or more MOS transistors (16, 18), wherein the source and drain terminals of each of the one or more MOS transistors (16, 18) are connected to each other and may be toggled between ground and a supply voltage.

公开(公告)号：US20200021765A1

公开(公告)日：2020-01-16

申请号：US16458641

申请日：2019-07-01

Applicant: IMEC VZW

Inventor： Annachiara Spagnolo ,  Jonathan Borremans

IPC: H04N5/378 ,  H04N5/357

Abstract: Example embodiments relate to an image sensor and a method for read-out of pixel signal. One embodiment includes an image sensor. The image sensor includes an array of pixels for detecting light incident on the pixel. The image sensor also includes an in-pixel correlated double sampling (CDS) circuitry. The image sensor also includes a column line that extends along and is associated with a column of pixels in the array of pixels. The column line is configured to selectively receive a pixel signal from a pixel in the column. Further, the image sensor includes a voltage-drop correction line that extends along and is associated with the column of pixels. The voltage-drop correction line is configured to provide a correction voltage signal to a pixel in the column such that corrects for voltage drop of the pixel signal in read-out through the column line.

公开(公告)号：US10778926B2

公开(公告)日：2020-09-15

申请号：US16458641

申请日：2019-07-01

Applicant: IMEC VZW

Inventor： Annachiara Spagnolo ,  Jonathan Borremans

IPC: H04N5/378 ,  H04N5/3745 ,  H04N5/365 ,  H04N5/357

Abstract: Example embodiments relate to an image sensor and a method for read-out of pixel signal. One embodiment includes an image sensor. The image sensor includes an array of pixels for detecting light incident on the pixel. The image sensor also includes an in-pixel correlated double sampling (CDS) circuitry. The image sensor also includes a column line that extends along and is associated with a column of pixels in the array of pixels. The column line is configured to selectively receive a pixel signal from a pixel in the column. Further, the image sensor includes a voltage-drop correction line that extends along and is associated with the column of pixels. The voltage-drop correction line is configured to provide a correction voltage signal to a pixel in the column such that corrects for voltage drop of the pixel signal in read-out through the column line.