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公开(公告)号：US11315231B2
公开(公告)日：2022-04-26
申请号：US16217904
申请日：2018-12-12
Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Inventor： Yu-Ting Lai , Jwu-Sheng Hu , Ya-Hui Tsai , Keng-Hao Chang
Abstract: An industrial image inspection method includes: generating a test latent vector of a test image; measuring a distance between a training latent vector of a normal image and the test latent vector of the test image; and judging whether the test image is normal or defected according to the distance between the training latent vector of the normal image and the test latent vector of the test image.
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