公开(公告)号：US10473730B2

公开(公告)日：2019-11-12

申请号：US15787001

申请日：2017-10-18

Applicant: INDUSTRY-ACADEMIC COOPERATION FOUNDATION CHOSUN UNIVERSITY

Inventor： Jin Yi Lee ,  Jung Min Kim ,  Myung Chul Jung ,  Ji Su Kim

IPC: G01N27/82 ,  G01R33/00 ,  G01N27/90

Abstract: A defect detection device enables easy removal of magnetic impurities. The defect detection device has a structure capable of effectively removing magnetic impurities adhered to a magnetic flux leakage detection device for nondestructive inspection of a small-diameter heat transfer tube or a partially saturated eddy current detection system. With the defect detection device, it is possible to minimize adhesion of magnetic impurities that deteriorate the performance of a leakage magnetic flux detection device for nondestructive inspection of a small-diameter tube of ferromagnetic metal material or a partially saturated eddy current detection system. Further, there is an advantage in that it is possible to remove the adhered magnetic impurities from the defect detection device easily.