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公开(公告)号：US09690092B2
公开(公告)日：2017-06-27
申请号：US14128915
申请日：2013-06-28
Applicant: Intel Corporation
Inventor： Barak Freedman , Sagi Ben Moshe , Ron Kimmel
CPC classification number: G02B26/0833 , G01B11/254 , G02B26/105 , G06K9/00604 , H04N13/204
Abstract: Techniques and configurations for an apparatus for projecting a light pattern on an object are described. In one embodiment, the apparatus may include a laser arrangement configured to generate a laser line, a tiltable micro-electromechanical system (MEMS) mirror configured to tiltably reflect the laser line, and a controller configured to control tilting of the MEMS mirror to enable the reflected laser line to project a light pattern on the object. The controller may be configured to control the MEMS mirror with a tilting frequency that is complementary to an optical power of the laser line, or to control the optical power of the laser line to be complementary to the tilting frequency of the MEMS mirror.
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公开(公告)号：US09819929B2
公开(公告)日：2017-11-14
申请号：US15251578
申请日：2016-08-30
Applicant: INTEL CORPORATION
Inventor： Ron Kimmel , Barak Freedman , Alex Bronstein , Michael Bronstein , Sagi Ben Moshe
CPC classification number: H04N13/246 , G06T7/521 , G06T7/80 , G06T2207/10024 , G06T2207/10028 , G06T2207/10048 , H04N5/2256 , H04N5/33 , H04N5/332 , H04N5/357 , H04N13/167 , H04N13/239 , H04N13/25 , H04N13/254 , H04N13/296
Abstract: Embodiments of the present disclosure provide techniques and configurations for an optoelectronic three-dimensional object acquisition assembly configured to correct image distortions. In one instance, the assembly may comprise a first device configured to project a light pattern on an object at a determined angle; a second device configured to capture a first image of the object illuminated with the projected light pattern; a third device configured to capture a second image of the object; and a controller coupled to the first, second, and third devices and configured to reconstruct an image of the object from geometric parameters of the object obtained from the first image, and to correct distortions in the reconstructed image caused by a variation of the determined angle of the light pattern projection, based at least in part on the first and second images of the object. Other embodiments may be described and/or claimed.
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公开(公告)号：US20170310947A1
公开(公告)日：2017-10-26
申请号：US15593313
申请日：2017-05-11
Applicant: INTEL CORPORATION
Inventor： Ron Kimmel , Barak Freedman , Alex Bronstein , Michael Bronstein , Sagi Ben Moshe
CPC classification number: H04N13/246 , G06T7/521 , G06T7/80 , G06T2207/10024 , G06T2207/10028 , G06T2207/10048 , H04N5/2256 , H04N5/33 , H04N5/332 , H04N5/357 , H04N13/167 , H04N13/239 , H04N13/25 , H04N13/254 , H04N13/296
Abstract: Embodiments of the present disclosure provide techniques and configurations for an optoelectronic three-dimensional object acquisition assembly configured to correct image distortions. In one instance, the assembly may comprise a first device configured to project a light pattern on an object at a determined angle; a second device configured to capture a first image of the object illuminated with the projected light pattern; a third device configured to capture a second image of the object; and a controller coupled to the first, second, and third devices and configured to reconstruct an image of the object from geometric parameters of the object obtained from the first image, and to correct distortions in the reconstructed image caused by a variation of the determined angle of the light pattern projection, based at least in part on the first and second images of the object. Other embodiments may be described and/or claimed.
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公开(公告)号：US20160373727A1
公开(公告)日：2016-12-22
申请号：US15251578
申请日：2016-08-30
Applicant: INTEL CORPORATION
Inventor： Ron Kimmel , Barak Freedman , Alex Bronstein , Michael Bronstein , Sagi Ben Moshe
CPC classification number: H04N13/246 , G06T7/521 , G06T7/80 , G06T2207/10024 , G06T2207/10028 , G06T2207/10048 , H04N5/2256 , H04N5/33 , H04N5/332 , H04N5/357 , H04N13/167 , H04N13/239 , H04N13/25 , H04N13/254 , H04N13/296
Abstract: Embodiments of the present disclosure provide techniques and configurations for an optoelectronic three-dimensional object acquisition assembly configured to correct image distortions. In one instance, the assembly may comprise a first device configured to project a light pattern on an object at a determined angle; a second device configured to capture a first image of the object illuminated with the projected light pattern; a third device configured to capture a second image of the object; and a controller coupled to the first, second, and third devices and configured to reconstruct an image of the object from geometric parameters of the object obtained from the first image, and to correct distortions in the reconstructed image caused by a variation of the determined angle of the light pattern projection, based at least in part on the first and second images of the object. Other embodiments may be described and/or claimed.
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Patent Agency Ranking
公开(公告)号：US20150172635A1
公开(公告)日：2015-06-18
申请号：US14104242
申请日：2013-12-12
Applicant: Intel Corporation
Inventor： Ron Kimmel , Barak Freedman , Alex Bronstein , Michael Bronstein , Sagi Ben Moshe
CPC classification number: H04N13/246 , G06T7/521 , G06T7/80 , G06T2207/10024 , G06T2207/10028 , G06T2207/10048 , H04N5/2256 , H04N5/33 , H04N5/332 , H04N5/357 , H04N13/167 , H04N13/239 , H04N13/25 , H04N13/254 , H04N13/296
Abstract: Embodiments of the present disclosure provide techniques and configurations for an optoelectronic three-dimensional object acquisition assembly configured to correct image distortions. In one instance, the assembly may comprise a first device configured to project a light pattern on an object at a determined angle; a second device configured to capture a first image of the object illuminated with the projected light pattern; a third device configured to capture a second image of the object; and a controller coupled to the first, second, and third devices and configured to reconstruct an image of the object from geometric parameters of the object obtained from the first image, and to correct distortions in the reconstructed image caused by a variation of the determined angle of the light pattern projection, based at least in part on the first and second images of the object. Other embodiments may be described and/or claimed.
Abstract translation: 本公开的实施例提供了用于校正图像失真的光电三维物体采集组件的技术和配置。 在一个实例中，组件可以包括被配置成以确定的角度将光图案投射在物体上的第一装置; 第二装置，被配置为捕获被投射的光图案照射的对象的第一图像; 被配置为捕获所述对象的第二图像的第三设备; 以及控制器，其耦合到所述第一，第二和第三设备，并且被配置为根据从所述第一图像获得的对象的几何参数重建所述对象的图像，并且校正由所确定的角度的变化引起的所述重建图像中的失真 至少部分地基于对象的第一和第二图像。 可以描述和/或要求保护其他实施例。
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公开(公告)号：US10593064B2
公开(公告)日：2020-03-17
申请号：US15475916
申请日：2017-03-31
Applicant: INTEL CORPORATION
Inventor： Sagi Ben Moshe , Ido Nissenboim , Aviad Zabatani , Erez Sperling , Omer Sella
Abstract: In accordance with disclosed embodiments, there is described a depth camera calibration system which includes: a depth camera to be calibrated; a calibration application to execute upon a mobile device, the calibration application to: (i) determine a precise image size of a calibration image to be displayed to a screen of the mobile device based on a screen size of the mobile device, the calibration image having embedded therein a plurality of objects of a known size, (ii) encode the known size of the objects into an optical machine-readable data representation, and (iii) display the encoded optical machine-readable data representation to the mobile device; in which the depth camera is to read the optical machine-readable data representation displayed by the mobile device to determine the known size of the objects of the calibration image; in which the calibration application is to display the calibration image to the mobile device; and in which an imager of the depth camera is to capture the objects of the coded image pattern and calibrate based on the known size of the objects of the captured calibration image. Other related embodiments are disclosed.
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公开(公告)号：US10027950B2
公开(公告)日：2018-07-17
申请号：US15593313
申请日：2017-05-11
Applicant: INTEL CORPORATION
Inventor： Ron Kimmel , Barak Freedman , Alex Bronstein , Michael Bronstein , Sagi Ben Moshe
Abstract: Embodiments of the present disclosure provide techniques and configurations for an optoelectronic three-dimensional object acquisition assembly configured to correct image distortions. In one instance, the assembly may comprise a first device configured to project a light pattern on an object at a determined angle; a second device configured to capture a first image of the object illuminated with the projected light pattern; a third device configured to capture a second image of the object; and a controller coupled to the first, second, and third devices and configured to reconstruct an image of the object from geometric parameters of the object obtained from the first image, and to correct distortions in the reconstructed image caused by a variation of the determined angle of the light pattern projection, based at least in part on the first and second images of the object. Other embodiments may be described and/or claimed.
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公开(公告)号：US09467680B2
公开(公告)日：2016-10-11
申请号：US14104242
申请日：2013-12-12
Applicant: Intel Corporation
Inventor： Ron Kimmel , Barak Freedman , Alex Bronstein , Michael Bronstein , Sagi Ben Moshe
CPC classification number: H04N13/246 , G06T7/521 , G06T7/80 , G06T2207/10024 , G06T2207/10028 , G06T2207/10048 , H04N5/2256 , H04N5/33 , H04N5/332 , H04N5/357 , H04N13/167 , H04N13/239 , H04N13/25 , H04N13/254 , H04N13/296
Abstract: Embodiments of the present disclosure provide techniques and configurations for an optoelectronic three-dimensional object acquisition assembly configured to correct image distortions. In one instance, the assembly may comprise a first device configured to project a light pattern on an object at a determined angle; a second device configured to capture a first image of the object illuminated with the projected light pattern; a third device configured to capture a second image of the object; and a controller coupled to the first, second, and third devices and configured to reconstruct an image of the object from geometric parameters of the object obtained from the first image, and to correct distortions in the reconstructed image caused by a variation of the determined angle of the light pattern projection, based at least in part on the first and second images of the object. Other embodiments may be described and/or claimed.
Abstract translation: 本公开的实施例提供了用于校正图像失真的光电三维物体采集组件的技术和配置。 在一个实例中，组件可以包括被配置成以确定的角度将光图案投射在物体上的第一装置; 第二装置，被配置为捕获被投射的光图案照射的对象的第一图像; 被配置为捕获所述对象的第二图像的第三设备; 以及控制器，其耦合到所述第一，第二和第三设备，并且被配置为根据从所述第一图像获得的对象的几何参数重建所述对象的图像，并且校正由所确定的角度的变化引起的所述重建图像中的失真 至少部分地基于对象的第一和第二图像。 可以描述和/或要求保护其他实施例。
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公开(公告)号：US20150198800A1
公开(公告)日：2015-07-16
申请号：US14128915
申请日：2013-06-28
Applicant: INTEL CORPORATION
Inventor： Barak Freedman , Sagi Ben Moshe , Ron Kimmel
CPC classification number: G02B26/0833 , G01B11/254 , G02B26/105 , G06K9/00604 , H04N13/204
Abstract: Embodiments of the present disclosure provide techniques and configurations for an apparatus for projecting a light pattern on an object. In one embodiment, the apparatus may include a laser arrangement configured to generate a laser line, a tiltable micro-electromechanical system (MEMS) mirror configured to tiltably reflect the laser line, and a controller configured to control tilting of the MEMS mirror to enable the reflected laser line to project a light pattern on the object. The controller may be configured to control the MEMS mirror with a tilting frequency that is complementary to an optical power of the laser line, or to control the optical power of the laser line to be complementary to the tilting frequency of the MEMS mirror. Other embodiments may be described and/or claimed.
Abstract translation: 本公开的实施例提供了用于将光图案投影在物体上的装置的技术和配置。 在一个实施例中，该装置可以包括被配置为产生激光线的激光装置，被配置为可倾斜地反射激光线的可倾斜的微机电系统（MEMS）反射镜，以及控制器，被配置为控制MEMS反射镜的倾斜， 反射激光线在物体上投射光线图案。 控制器可以被配置为以与激光线的光功率互补的倾斜频率来控制MEMS反射镜，或者控制激光线的光功率与MEMS反射镜的倾斜频率互补。 可以描述和/或要求保护其他实施例。
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