ISOLATED BOTTOM CORNER GATES FOR SPIN-QUBITS IN A FIN

    公开(公告)号:US20240135223A1

    公开(公告)日:2024-04-25

    申请号:US18048430

    申请日:2022-10-19

    CPC classification number: G06N10/40

    Abstract: A qubit device or system having isolated bottom corner gates includes a semiconductor substrate and a semiconductor fin perpendicularly adjoining a top surface of the substrate. The qubit device also includes a first gate located at a first corner between a first side of the fin and the top surface of the substrate, and a second gate located at a second corner between a second, opposite side of the fin and the top surface of the substrate. The first and second gates are electrically isolated from each other and used to control a first quantum dot near the top of the fin. A third gate located at the first corner has a contact for accumulating a channel to facilitate charge transport to and from a second quantum dot located near the bottom of the fin accumulated using the first and second gates.

    ISOLATED BOTTOM CORNER GATES FOR SPIN-QUBITS IN A FIN

    公开(公告)号:US20240232674A9

    公开(公告)日:2024-07-11

    申请号:US18048430

    申请日:2022-10-20

    CPC classification number: G06N10/40

    Abstract: A qubit device or system having isolated bottom corner gates includes a semiconductor substrate and a semiconductor fin perpendicularly adjoining a top surface of the substrate. The qubit device also includes a first gate located at a first corner between a first side of the fin and the top surface of the substrate, and a second gate located at a second corner between a second, opposite side of the fin and the top surface of the substrate. The first and second gates are electrically isolated from each other and used to control a first quantum dot near the top of the fin. A third gate located at the first corner has a contact for accumulating a channel to facilitate charge transport to and from a second quantum dot located near the bottom of the fin accumulated using the first and second gates.

    Resonance frequency adjustment for fixed-frequency qubits

    公开(公告)号:US11251355B2

    公开(公告)日:2022-02-15

    申请号:US16292643

    申请日:2019-03-05

    Abstract: A method of an embodiment includes forming a capacitor pad for a nonlinear resonator. In an embodiment, the method includes comparing a resonance frequency of the nonlinear resonator to a target frequency to determine whether the resonance frequency falls within a range of the target frequency. A device of an embodiment includes a first capacitor pad comprising a superconducting material, the first capacitor pad configured to couple to a first end of a logic circuit element. In an embodiment, the device includes a second capacitor pad comprising a second superconducting material, the capacitor pad configured to couple to a second end of the logic circuit element. In an embodiment, the second capacitor pad includes a first portion; a second portion; and a bridge configured to electrically connect the first portion and the second portion.

    Operating a superconducting channel by electron injection

    公开(公告)号:US11165429B2

    公开(公告)日:2021-11-02

    申请号:US16831241

    申请日:2020-03-26

    Abstract: The invention is notably directed to a method of operating a superconducting channel. The method relies on a device including: a potentially superconducting material; a gate electrode; and an electrically insulating medium. A channel is defined by the potentially superconducting material. The gate electrode positioned adjacent to the channel, such that an end surface of the gate electrode faces a portion of the channel. The electrically insulating medium is arranged in such a manner that it electrically insulates the gate electrode from the channel. Rendering the channel superconducting by cooling down the device. Next, a voltage difference is applied between the gate electrode and the channel to inject electrons in the channel through the electrically insulating medium and thereby generate a gate current between the gate electrode and the channel. The electrons are injected with an average energy sufficient to modify a critical current IC of the channel.

    Dual-sideband microwave interferometer

    公开(公告)号:US11946964B2

    公开(公告)日:2024-04-02

    申请号:US17562391

    申请日:2021-12-27

    CPC classification number: G01R29/0892 G06N10/40

    Abstract: One or more systems, devices and/or methods of use provided herein relate to a device that can facilitate a process to measure a pair of spectral sidebands and suppress one of common mode phase or amplitude noise. A device can comprise an interferometer device that can detect an interference of two spectral sidebands. The interferometer device can comprise a signal circuit that can detect at least one of a phase or an amplitude of a signal resulting from the interference of the two spectral sidebands, an IQ modulator that can generate the two spectral sidebands using a portion of a local oscillator (LO) microwave signal and a pair of signals at a same intermediate frequency, and/or a mixer that can interfere the two spectral sidebands having been output or reflected from a device under test, including mixing the two spectral sidebands with another portion of the LO microwave signal.

    DUAL-SIDEBAND MICROWAVE INTERFEROMETER
    9.
    发明公开

    公开(公告)号:US20230204647A1

    公开(公告)日:2023-06-29

    申请号:US17562391

    申请日:2021-12-27

    CPC classification number: G01R29/0892 G06N10/40

    Abstract: One or more systems, devices and/or methods of use provided herein relate to a device that can facilitate a process to measure a pair of spectral sidebands and suppress one of common mode phase or amplitude noise. A device can comprise an interferometer device that can detect an interference of two spectral sidebands. The interferometer device can comprise a signal circuit that can detect at least one of a phase or an amplitude of a signal resulting from the interference of the two spectral sidebands, an IQ modulator that can generate the two spectral sidebands using a portion of a local oscillator (LO) microwave signal and a pair of signals at a same intermediate frequency, and/or a mixer that can interfere the two spectral sidebands having been output or reflected from a device under test, including mixing the two spectral sidebands with another portion of the LO microwave signal.

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