公开(公告)号：US20210004951A1

公开(公告)日：2021-01-07

申请号：US16917052

申请日：2020-06-30

Applicant: ISHIDA CO., LTD.

Inventor： Atsushi IWAI ,  Futoshi YURUGI ,  Kota TOMINAGA ,  Hiroaki MAKI

IPC: G06T7/00 ,  G06T7/90

Abstract: An X-ray inspection apparatus includes a storage unit configured to store therein a plurality of image processing algorithms; an acquisition unit configured to acquire, as a reference transmission image, a transmission image obtained by transmitting electromagnetic waves through an article to which a foreign matter is attached or a synthesized transmission image; an evaluation unit configured to evaluate detection accuracy of the foreign matter for each image processing algorithm based on an evaluation image obtained by processing the reference transmission image with the image processing algorithms stored in the storage unit; and a setting unit configured to set at least one of the image processing algorithms as an image processing algorithm selected in advance based on evaluation in the evaluation unit.