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公开(公告)号:US20240288592A1
公开(公告)日:2024-08-29
申请号:US18584859
申请日:2024-02-22
Applicant: ISHIDA CO., LTD.
Inventor: Futoshi YURUGI , Yoshiaki SAKAGAMI , Atsushi YAMAKAWA , Kota TOMINAGA
CPC classification number: G01T1/175 , G01N23/04 , G01N2223/1016 , G01N2223/3103 , G01N2223/643
Abstract: An X-ray inspection apparatus includes: a conveyance unit; an X-ray irradiation unit that irradiates an article conveyed by the conveyance unit with an X-ray; an X-ray detection unit that detects the X-ray that has transmitted through the article; an inspection unit that generates an X-ray transmission image from the X-ray detected by the X-ray detection unit and inspects the article on the basis of the X-ray transmission image; a housing that houses the X-ray irradiation unit and the X-ray detection unit; a cold air blower that cools air in the housing and guides cold air to the X-ray detection unit via a duct; a monitoring unit that monitors a state of the cold air blower; and a control unit that stops the supply of electric power to the X-ray detection unit in a case where an abnormality in the cold air blower is detected in the monitoring unit.
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公开(公告)号:US20210004951A1
公开(公告)日:2021-01-07
申请号:US16917052
申请日:2020-06-30
Applicant: ISHIDA CO., LTD.
Inventor: Atsushi IWAI , Futoshi YURUGI , Kota TOMINAGA , Hiroaki MAKI
Abstract: An X-ray inspection apparatus includes a storage unit configured to store therein a plurality of image processing algorithms; an acquisition unit configured to acquire, as a reference transmission image, a transmission image obtained by transmitting electromagnetic waves through an article to which a foreign matter is attached or a synthesized transmission image; an evaluation unit configured to evaluate detection accuracy of the foreign matter for each image processing algorithm based on an evaluation image obtained by processing the reference transmission image with the image processing algorithms stored in the storage unit; and a setting unit configured to set at least one of the image processing algorithms as an image processing algorithm selected in advance based on evaluation in the evaluation unit.
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公开(公告)号:US20250137944A1
公开(公告)日:2025-05-01
申请号:US18923777
申请日:2024-10-23
Applicant: ISHIDA CO., LTD.
Inventor: Futoshi YURUGI , Kota TOMINAGA , Shojiro KITA , Satoshi ONDA
IPC: G01N23/18 , G01N23/04 , G01N23/083 , G01N33/02
Abstract: An X-ray inspection apparatus includes a conveying unit configured to convey an article, an irradiation unit configured to irradiate the article conveyed by the conveying unit with X-rays, a sensor unit in which detecting elements are arranged in a planar shape, an image generation unit configured to read detection results output from at least some of the detecting elements and generate an image, and a mode switching unit configured to switch an operation mode between a first mode in which a first electric power is supplied to the irradiation unit and a second mode in which a second electric power less than the first electric power is supplied to the irradiation unit, where the mode switching unit changes, when switching the operation mode from the first mode to the second mode, a read frequency at which the image generation unit reads the detection results.
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公开(公告)号:US20240319118A1
公开(公告)日:2024-09-26
申请号:US18605792
申请日:2024-03-14
Applicant: ISHIDA CO., LTD.
Inventor: Kota TOMINAGA
IPC: G01N23/04 , G01N23/083
CPC classification number: G01N23/04 , G01N23/083 , G01N2223/643
Abstract: An X-ray inspection apparatus includes: a conveying unit; an irradiation unit configured to irradiate the article with an electromagnetic wave; a detection unit configured to detect the electromagnetic wave transmitted through the article; a housing configured to accommodate the detection unit; and an inspection unit configured to inspect the article. The conveying unit includes a pair of conveying units, a plate member is provided between the passing region and the detection unit, and the plate member is attached to a wall portion that is a part of the housing, and a surface of the plate member is located lower than an upper surface of the wall portion.
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公开(公告)号:US20250137945A1
公开(公告)日:2025-05-01
申请号:US18923783
申请日:2024-10-23
Applicant: ISHIDA CO., LTD.
Inventor: Futoshi YURUGI , Kota TOMINAGA
Abstract: An X-ray inspection apparatus includes a conveying unit configured to convey an article, an irradiation unit configured to irradiate the article conveyed by the conveying unit with X-rays, a sensor unit in which detecting elements that detect the X-rays are arranged in a planar shape, an image generation unit configured to read detection results output from at least some of the detecting elements at a predetermined time interval and generate an image, and a time setting unit configured to set the predetermined time interval, where the time setting unit is configured to multiplies the predetermined time interval by a magnification set on the basis of a conveyance speed of the conveying unit or the detection results.
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公开(公告)号:US20240319117A1
公开(公告)日:2024-09-26
申请号:US18605787
申请日:2024-03-14
Applicant: ISHIDA CO., LTD.
Inventor: Kota TOMINAGA
IPC: G01N23/04
CPC classification number: G01N23/04 , G01N2223/304 , G01N2223/3308
Abstract: An X-ray inspection apparatus includes: a conveying unit; an irradiation unit configured to irradiate an article with an electromagnetic wave; a detection unit configured to detect the electromagnetic wave transmitted through the article; an inspection unit configured to inspect the article; and a determination unit configured to determine attachment of the conveying unit. The conveying unit includes first and second conveying units. The determination unit includes: a support portion attached to the first conveying unit; a swing member swingably attached to the second conveying unit and at least partially in contact with the support portion when the first and second conveying units are attached; and a sensor unit configured to detect whether the swing member is present at a predetermined position in a state where the swing member is in contact with the support portion.
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公开(公告)号:US20240219324A1
公开(公告)日:2024-07-04
申请号:US18539236
申请日:2023-12-13
Applicant: ISHIDA CO., LTD.
Inventor: Futoshi YURUGI , Yoshiaki SAKAGAMI , Atsushi YAMAKAWA , Kota TOMINAGA
IPC: G01N23/083 , G01N23/04
CPC classification number: G01N23/083 , G01N23/04 , G01N2223/3103 , G01N2223/643
Abstract: An X-ray inspection device includes a conveyor, an X-ray irradiation unit, an X-ray detection unit, an inspection unit configured to inspect an article on the basis of an X-ray transmission image, a housing accommodating the X-ray irradiation unit and the X-ray detection unit, a cool air blower configured to cool air inside the housing and guide cool air to the X-ray detection unit via a duct, a monitoring unit configured to monitor a state of the cool air blower, and a control unit configured to stop the flow of air to the X-ray detection unit when an anomaly of the cool air blower is detected by the monitoring unit.
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