公开(公告)号：US11792387B2

公开(公告)日：2023-10-17

申请号：US17894501

申请日：2022-08-24

Applicant: Ignis Innovation Inc.

Inventor： Vyacheslav Shyshkin ,  Adam Saechao

IPC: G09G3/00 ,  G09G3/3225 ,  H04N17/04 ,  G01J1/02 ,  G01J1/32

CPC classification number: H04N17/04 ,  G01J1/0228 ,  G01J1/32 ,  G09G3/006 ,  G09G3/3225 ,  G09G2320/0233 ,  G09G2320/0693

Abstract: What is disclosed are systems and methods of optical correction for pixel evaluation and correction for active matrix light emitting diode device (AMOLED) and other emissive displays. Optical correction for correcting for non-homogeneity of a display panel uses sparse display test patterns in conjunction with a defocused camera as the measurement device to avoid aliasing (moiré) of the pixels of the display in the captured images.

公开(公告)号：US20190052872A1

公开(公告)日：2019-02-14

申请号：US15675095

申请日：2017-08-11

Applicant: Ignis Innovation Inc.

Inventor： Vyacheslav Shyshkin ,  Adam Saechao

IPC: H04N17/04 ,  G09G3/3225 ,  G01J1/32 ,  G01J1/02

Abstract: What is disclosed are systems and methods of optical correction for pixel evaluation and correction for active matrix light emitting diode device (AMOLED) and other emissive displays. Optical correction for correcting for non-homogeneity of a display panel uses sparse display test patterns in conjunction with a defocused camera as the measurement device to avoid aliasing (moiré) of the pixels of the display in the captured images.

公开(公告)号：US11917309B2

公开(公告)日：2024-02-27

申请号：US18184343

申请日：2023-03-15

Applicant: Ignis Innovation Inc.

Inventor： Vyacheslav Shyshkin

IPC: H04N25/40 ,  G06T7/33 ,  G06T7/73 ,  G06T7/80 ,  G09G3/3233 ,  H01L27/146

CPC classification number: H04N25/40 ,  G06T7/33 ,  G06T7/73 ,  G06T7/80 ,  G09G3/3233 ,  H01L27/14609 ,  G06T2207/10024 ,  G09G2300/0842 ,  G09G2320/0233 ,  G09G2320/029 ,  G09G2320/041 ,  G09G2320/045 ,  G09G2320/0693 ,  G09G2330/10

Abstract: What is disclosed are systems and methods for optical correction for correcting for non-uniformity in active matrix light emitting diode device (AMOLED) and other emissive displays, using iterative processing of images of calibration patterns including features of coarse and fine granularity to successively generate a high-resolution estimate of the panel pixel locations.

公开(公告)号：US20240005856A1

公开(公告)日：2024-01-04

申请号：US18468757

申请日：2023-09-18

Applicant: Ignis Innovation Inc.

Inventor： Vyacheslav Shyshkin ,  Adam Saechao

IPC: G09G3/3225 ,  H04N23/67

CPC classification number: G09G3/3225 ,  G09G2320/0233 ,  H04N23/67

Abstract: What is disclosed are systems and methods of optical correction for pixel evaluation and correction for active matrix light emitting diode device (AMOLED) and other emissive displays. Optical correction for correcting for non-homogeneity of a display panel uses sparse display test patterns in conjunction with a defocused camera as the measurement device to avoid aliasing (moiré) of the pixels of the display in the captured images.

公开(公告)号：US20230224597A1

公开(公告)日：2023-07-13

申请号：US18184343

申请日：2023-03-15

Applicant: Ignis Innovation Inc.

Inventor： Vyacheslav Shyshkin

IPC: G09G3/3233 ,  G06T7/73

CPC classification number: G09G3/3233 ,  G06T7/73 ,  G06T2207/10024 ,  G09G2320/0693 ,  G09G2320/0233 ,  G09G2320/029 ,  G09G2300/0842 ,  G09G2320/045 ,  G09G2320/041 ,  G09G2330/10

Abstract: What is disclosed are systems and methods for optical correction for correcting for non-uniformity in active matrix light emitting diode device (AMOLED) and other emissive displays, using iterative processing of images of calibration patterns including features of coarse and fine granularity to successively generate a high-resolution estimate of the panel pixel locations.

公开(公告)号：US20210250574A1

公开(公告)日：2021-08-12

申请号：US17245090

申请日：2021-04-30

Applicant: Ignis Innovation Inc.

Inventor： Vyacheslav Shyshkin ,  Adam Saechao

IPC: H04N17/04 ,  G09G3/00 ,  G01J1/02 ,  G01J1/32 ,  G09G3/3225

Abstract: What is disclosed are systems and methods of optical correction for pixel evaluation and correction for active matrix light emitting diode device (AMOLED) and other emissive displays. Optical correction for correcting for non-homogeneity of a display panel uses sparse display test patterns in conjunction with a defocused camera as the measurement device to avoid aliasing (moire) of the pixels of the display in the captured images.

公开(公告)号：US11637973B2

公开(公告)日：2023-04-25

申请号：US16999184

申请日：2020-08-21

Applicant: Ignis Innovation Inc.

Inventor： Vyacheslav Shyshkin

IPC: H04N5/341 ,  G06T7/80 ,  G06T7/33 ,  H01L27/146

Abstract: What is disclosed are systems and methods for optical correction for correcting for non-uniformity in active matrix light emitting diode device (AMOLED) and other emissive displays, using iterative processing of images of calibration patterns including features of coarse and fine granularity to successively generate a high-resolution estimate of the panel pixel locations.

公开(公告)号：US20230007236A1

公开(公告)日：2023-01-05

申请号：US17894501

申请日：2022-08-24

Applicant: Ignis Innovation Inc.

Inventor： Vyacheslav Shyshkin ,  Adam Saechao

IPC: H04N17/04 ,  G09G3/00 ,  G01J1/02 ,  G01J1/32 ,  G09G3/3225

Abstract: What is disclosed are systems and methods of optical correction for pixel evaluation and correction for active matrix light emitting diode device (AMOLED) and other emissive displays. Optical correction for correcting for non-homogeneity of a display panel uses sparse display test patterns in conjunction with a defocused camera as the measurement device to avoid aliasing (moiré) of the pixels of the display in the captured images.

公开(公告)号：US20240314457A1

公开(公告)日：2024-09-19

申请号：US18422369

申请日：2024-01-25

Applicant: Ignis Innovation Inc.

Inventor： Vyacheslav Shyshkin

IPC: H04N25/40 ,  G06T7/33 ,  G06T7/73 ,  G06T7/80 ,  G09G3/3233 ,  H01L27/146

CPC classification number: H04N25/40 ,  G06T7/33 ,  G06T7/73 ,  G06T7/80 ,  G09G3/3233 ,  H01L27/14609 ,  G06T2207/10024 ,  G09G2300/0842 ,  G09G2320/0233 ,  G09G2320/029 ,  G09G2320/041 ,  G09G2320/045 ,  G09G2320/0693 ,  G09G2330/10

Abstract: What is disclosed are systems and methods for optical correction for correcting for non-uniformity in active matrix light emitting diode device (AMOLED) and other emissive displays, using iterative processing of images of calibration patterns including features of coarse and fine granularity to successively generate a high-resolution estimate of the panel pixel locations.

公开(公告)号：US11457206B2

公开(公告)日：2022-09-27

申请号：US17245090

申请日：2021-04-30

Applicant: Ignis Innovation Inc.

Inventor： Vyacheslav Shyshkin ,  Adam Saechao

IPC: G09G3/00 ,  G09G3/3225 ,  H04N17/04 ,  G01J1/02 ,  G01J1/32

Abstract: What is disclosed are systems and methods of optical correction for pixel evaluation and correction for active matrix light emitting diode device (AMOLED) and other emissive displays. Optical correction for correcting for non-homogeneity of a display panel uses sparse display test patterns in conjunction with a defocused camera as the measurement device to avoid aliasing (moiré) of the pixels of the display in the captured images.