Electrical monitoring and control system
    1.
    发明申请
    Electrical monitoring and control system 失效
    电气监控系统

    公开(公告)号:US20090222142A1

    公开(公告)日:2009-09-03

    申请号:US12380460

    申请日:2009-02-27

    IPC分类号: G05B15/02 G05B15/00

    CPC分类号: G05B15/02 G05B2219/2642

    摘要: A system for monitoring and controlling the electrical infrastructure of a building includes at least one sensor for sensing an operating characteristic in the building, and a processor for receiving information from the at least one sensor and predicting a future operating characteristic.

    摘要翻译: 用于监测和控制建筑物的电气基础设施的系统包括用于感测建筑物中的操作特性的至少一个传感器,以及用于从所述至少一个传感器接收信息并预测未来工作特性的处理器。

    ELECTRICAL MONITORING AND CONTROL SYSTEM
    2.
    发明申请
    ELECTRICAL MONITORING AND CONTROL SYSTEM 有权
    电气监控与控制系统

    公开(公告)号:US20130073103A1

    公开(公告)日:2013-03-21

    申请号:US13545153

    申请日:2012-07-10

    IPC分类号: G06F1/26

    CPC分类号: G05B15/02 G05B2219/2642

    摘要: A system for monitoring and controlling the electrical infrastructure of a building includes at least one sensor for sensing an operating characteristic in the building, and a processor for receiving information from the at least one sensor and predicting a future operating characteristic.

    摘要翻译: 用于监测和控制建筑物的电气基础设施的系统包括用于感测建筑物中的操作特性的至少一个传感器,以及用于从所述至少一个传感器接收信息并预测未来工作特性的处理器。

    Electrical monitoring and control system
    3.
    发明授权
    Electrical monitoring and control system 失效
    电气监控系统

    公开(公告)号:US08244405B2

    公开(公告)日:2012-08-14

    申请号:US12380460

    申请日:2009-02-27

    IPC分类号: G05D11/00

    CPC分类号: G05B15/02 G05B2219/2642

    摘要: A system for monitoring and controlling the electrical infrastructure of a building includes at least one sensor for sensing an operating characteristic in the building, and a processor for receiving information from the at least one sensor and predicting a future operating characteristic.

    摘要翻译: 用于监测和控制建筑物的电气基础设施的系统包括用于感测建筑物中的操作特性的至少一个传感器,以及用于从所述至少一个传感器接收信息并预测未来工作特性的处理器。

    Electrical monitoring and control system
    4.
    发明授权
    Electrical monitoring and control system 有权
    电气监控系统

    公开(公告)号:US08738184B2

    公开(公告)日:2014-05-27

    申请号:US13545153

    申请日:2012-07-10

    IPC分类号: G05D23/00

    CPC分类号: G05B15/02 G05B2219/2642

    摘要: A system for monitoring and controlling the electrical infrastructure of a building includes at least one sensor for sensing an operating characteristic in the building, and a processor for receiving information from the at least one sensor and predicting a future operating characteristic.

    摘要翻译: 用于监测和控制建筑物的电气基础设施的系统包括用于感测建筑物中的操作特性的至少一个传感器,以及用于从所述至少一个传感器接收信息并预测未来工作特性的处理器。

    Microvalve
    5.
    发明授权

    公开(公告)号:US06592098B2

    公开(公告)日:2003-07-15

    申请号:US09982722

    申请日:2001-10-18

    IPC分类号: F16K3100

    摘要: An improved microvalve device is configured to provide a more robust and durable operation to withstand the demands of various operating environments. The microvalve may comprise a valve seat and a diaphragm, with the diaphragm operated by an external actuator device, such as a bladder, through various mechanisms of actuation, such as direct and indirect mechanisms, that are separate from the microvalve. Through use of the various mechanisms of actuation, the actuator device is configured to apply forces on the diaphragm to suitably move the diaphragm to open and close the microvalve. The valve seat and diaphragm can be configured to provide the microvalve with a plurality of openings configured to permit flow thereinbetween. In addition, the microvalve may be configured to facilitate uni-directional or bi-directional flow. Further, a plurality of microvalves can be cascaded together in a parallel and/or series configuration, with each valve having similar or different flow characteristics, and being selectively operated. The microvalve can also include a combination gate valve configuration and a bladder configuration to provide high frequency response characteristics in addition to stability and reduction in leak flow.

    Computer based semi-automatic focusing and assembly apparatus and method
    6.
    发明授权
    Computer based semi-automatic focusing and assembly apparatus and method 失效
    电脑半自动聚焦装配装置及方法

    公开(公告)号:US06399937B1

    公开(公告)日:2002-06-04

    申请号:US09601822

    申请日:2000-08-08

    IPC分类号: H01J314

    CPC分类号: G06K7/10811

    摘要: An apparatus and method for semi-automatic focusing and assembling of a light beam modifier, such as a lens, relative to a light beam source to optimize the light beam characteristics at one or more locations along the beam path using one or more light beam analyzers (27, 28, 29). A host computer compares the measurements and axially adjusts the light beam modifier. The apparatus may include two focusing stations (21, 22) for alternately focusing and assembling two light source assemblies, two beam splitters (25, 26) for splitting the light beam emitted from either focusing station into three components, and three light beam analyzers for measuring the beam characteristics at three locations. The apparatus may also include a video camera for automated or manual pointing of the laser beam, a semi-automatic glue dispensing system for fixing the light beam modifier relative to the light source and an automatic laser power-up circuit.

    摘要翻译: 一种用于相对于光束源的诸如透镜的光束修改器半自动聚焦和组装的装置和方法,以使用一个或多个光束分析器在光束路径的一个或多个位置处优化光束特性 (27,28,29)。 主机比较测量并轴向调整光束修正器。 该装置可以包括用于交替聚焦和组装两个光源组件的两个聚焦台(21,22),用于将从聚焦站发射的光束分成三个部件的两个分束器(25,26)和三个光束分析器 测量三个位置的光束特性。 该装置还可以包括用于自动或手动指示激光束的摄像机,用于相对于光源固定光束修改器的半自动胶水分配系统和自动激光加电电路。

    Shadow moire surface measurement using Talbot effect
    7.
    发明授权
    Shadow moire surface measurement using Talbot effect 失效
    使用Talbot效果的阴影莫尔表面测量

    公开(公告)号:US06731391B1

    公开(公告)日:2004-05-04

    申请号:US09674822

    申请日:2001-01-29

    IPC分类号: G01B1124

    CPC分类号: G01B11/254

    摘要: A method and apparatus for surface measurement using the shadow moire effect with the Talbot effect. The apparatus includes a specimen mount to receive a specimen having a surface to be measured, and a reference grating mounted adjacent to the specimen mount so as to be substantially parallel to a mean surface plane of the specimen. The reference grating is mounted in such a manner that the distance between the reference grating and the mean surface plane of the specimen can be adjusted to a Talbot distance &dgr;T. The apparatus also includes a light source to illuminate the specimen through the grating and a detector positioned to detect the moire fringes produced by the grating due to variation of the surface of the specimen.

    摘要翻译: 使用Talbot效应的阴影莫尔效应的表面测量方法和装置。 该装置包括用于接收具有待测表面的试样的试样支架和安装在试样支架附近的参考光栅,以便基本平行于试样的平均表面。 参考光栅以这样的方式安装,使得参考光栅与样品的平均表面平面之间的距离可以调节到塔尔博特距离deltaT。 该装置还包括通过光栅照射样本的光源和用于检测由于样品表面的变化而由光栅产生的莫尔条纹的检测器。