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    Strain measurement method and strain measurement apparatus
    1.
    发明授权
    Strain measurement method and strain measurement apparatus 有权

    公开(公告)号：US11204240B2

    公开(公告)日：2021-12-21

    申请号：US16937592

    申请日：2020-07-24

    Applicant: Industrial Technology Research Institute

    Inventor： I-Hung Chiang ,  Hung-Hsien Ko ,  Cheng-Ta Pan ,  Yu-Lin Hsu ,  Kuo-Hua Tseng

    IPC: G01B11/16 ,  G01N21/88 ,  G06T7/55

    Abstract: A strain measurement method includes disposing a 3D camera module at a first measurement position; using the 3D camera module to acquire a first 3D image of a to-be-measured object at a first to-be-measured position; acquiring a second 3D image of the to-be-measured object at the first to-be-measured position; and splicing the first and second 3D images to obtain an initial 3D image. The method still includes: moving the 3D camera module from the first measurement position to a second measurement position; using the 3D camera module to acquire a third 3D image of the to-be-measured object at a second to-be-measured position; acquiring a fourth 3D image of the to-be-measured object at the second to-be-measured position; and splicing the third and fourth 3D images to obtain a deformed 3D image. The method further includes comparing the initial 3D image and the deformed 3D image to output 3D deformation information.

    Circuit board and electronic device
    3.
    发明授权
    Circuit board and electronic device 有权

    公开(公告)号：US10932361B2

    公开(公告)日：2021-02-23

    申请号：US16431695

    申请日：2019-06-04

    Applicant: Industrial Technology Research Institute

    Inventor： Cheng-Ta Pan ,  Hsien-Chie Cheng ,  Zi-Hao Ye ,  Kung-Chieh Huang

    IPC: H05K1/00 ,  H05K1/02

    Abstract: A circuit board includes a substrate and at least one circuit structure. The substrate has first slots, each first slot extends along a first axis, and a length of each first slot along the first axis is greater than lengths of each first slot along other directions. The circuit structure is disposed on the substrate and includes arc segments and extending segments. Each arc segment is connected between two of the extending segments such that the circuit structure is circuitous. The circuit structure and each first slot have an interval therebetween such that each first slot and a part of a surface of the substrate are exposed by the circuit structure. Each first slot is located between adjacent two extending segments, and the first axis of each first slot passes through the corresponding arc segment. In addition, an electronic device having the circuit board is also provided.

    STRAIN MEASUREMENT METHOD AND STRAIN MEASUREMENT APPARATUS
    4.
    发明申请
    STRAIN MEASUREMENT METHOD AND STRAIN MEASUREMENT APPARATUS 有权

    公开(公告)号：US20210356403A1

    公开(公告)日：2021-11-18

    申请号：US16937592

    申请日：2020-07-24

    Applicant: Industrial Technology Research Institute

    Inventor： I-Hung Chiang ,  Hung-Hsien Ko ,  Cheng-Ta Pan ,  Yu-Lin Hsu ,  Kuo-Hua Tseng

    IPC: G01N21/88

    Abstract: A strain measurement method includes disposing a 3D camera module at a first measurement position; using the 3D camera module to acquire a first 3D image of a to-be-measured object at a first to-be-measured position; acquiring a second 3D image of the to-be-measured object at the first to-be-measured position; and splicing the first and second 3D images to obtain an initial 3D image. The method still includes: moving the 3D camera module from the first measurement position to a second measurement position; using the 3D camera module to acquire a third 3D image of the to-be-measured object at a second to-be-measured position; acquiring a fourth 3D image of the to-be-measured object at the second to-be-measured position; and splicing the third and fourth 3D images to obtain a deformed 3D image. The method further includes comparing the initial 3D image and the deformed 3D image to output 3D deformation information.

    STRETCHABLE ELECTRONICS GENERATING APPARATUS AND LAYOUT METHOD THEREOF
    7.
    发明申请
    STRETCHABLE ELECTRONICS GENERATING APPARATUS AND LAYOUT METHOD THEREOF 审中-公开

    公开(公告)号：US20200159982A1

    公开(公告)日：2020-05-21

    申请号：US16686215

    申请日：2019-11-18

    Applicant: Industrial Technology Research Institute

    Inventor： Cheng-Ta Pan ,  Hung-Hsien Ko ,  Cheng-Chung Lee ,  Chang-Ying Chen ,  Wen-Yung Yeh

    IPC: G06F30/394 ,  H05K3/00 ,  H05K1/02

    Abstract: A stretchable electronics generating apparatus and layout method thereof are provided. The layout method includes: establishing a layout database, wherein the layout database recodes a plurality of layout selection information respectively corresponding to a plurality of strain/stress information; detecting a layout target area to obtain a strain/stress distribution status of the layout target area; generating a wire routing information according to the strain/stress distribution status based on the layout database; and transporting the wire routing information to a manufacture device of the conductive wires for disposing a plurality of physical conductive wires on the layout target area by the manufacture device.

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