公开(公告)号：US20220114419A1

公开(公告)日：2022-04-14

申请号：US17121763

申请日：2020-12-15

Applicant: Industrial Technology Research Institute

Inventor： Yu-Shan Deng ,  An-Chun Luo ,  Po-Han Chang ,  Chun-Ju Lin ,  Ming-Ji Dai

IPC: G06N3/04

Abstract: A classification device and a classification method based on a neural network are provided. A heterogeneous integration module includes a convolutional layer, a data normalization layer, a connected layer and a classification layer. The convolutional layer generates a first feature map according to a first image data. The data normalization layer normalizes a first numerical data to generate a first normalized numerical data. The first numerical data corresponds to the first image data. The connected layer generates a first feature vector according to the first feature map and the first normalized numerical data. The classification layer generates a first classification result corresponding to a first time point according to the first feature vector. The heterogeneous integration module generates a second classification result corresponding to a second time point. A recurrent neural network generates a third classification result according to the first classification result and the second classification result.

公开(公告)号：US20190213725A1

公开(公告)日：2019-07-11

申请号：US16134986

申请日：2018-09-19

Applicant: Industrial Technology Research Institute

Inventor： Ming-Kaan Liang ,  An-Chun Luo ,  Yu-Shan Deng ,  Chih-Ming Shen ,  Ming-Ji Dai

IPC: G06T7/00 ,  G06N3/08 ,  G06K9/62

CPC classification number: G06T7/001 ,  G06K9/6267 ,  G06N3/08 ,  G06T2207/20132 ,  G06T2207/30141

Abstract: A board defect filtering method is provided. The method includes: receiving a defect list; obtaining a plurality of defect images of a plurality of defect records on the defect list; receiving a circuit layout image; analyzing a defect location of a first defect image of the plurality of defect images according to the circuit layout image; cropping the first defect image to obtain a first cropped defect image according to the defect location; inputting the first cropping defect image to a defect classifying model; and determining whether the first defect image is a qualified product image or not according to an output result of the defect classifying model.

公开(公告)号：US11132786B2

公开(公告)日：2021-09-28

申请号：US16134986

申请日：2018-09-19

Applicant: Industrial Technology Research Institute

Inventor： Ming-Kaan Liang ,  An-Chun Luo ,  Yu-Shan Deng ,  Chih-Ming Shen ,  Ming-Ji Dai

IPC: G06T7/00 ,  G06N3/08 ,  G06K9/62

Abstract: A board defect filtering method is provided. The method includes: receiving a defect list; obtaining a plurality of defect images of a plurality of defect records on the defect list; receiving a circuit layout image; analyzing a defect location of a first defect image of the plurality of defect images according to the circuit layout image; cropping the first defect image to obtain a first cropped defect image according to the defect location; inputting the first cropping defect image to a defect classifying model; and determining whether the first defect image is a qualified product image or not according to an output result of the defect classifying model.