公开(公告)号：US11867771B2

公开(公告)日：2024-01-09

申请号：US17589751

申请日：2022-01-31

Applicant: Infineon Technologies AG

Inventor： Felix Kaiser ,  Christoph Grund ,  Goran Keser ,  Christopher Roemmelmayer

IPC: G01R31/52

CPC classification number: G01R31/52

Abstract: Methods and devices for detecting electrical arcs are provided. A first wavelet transformation with a first mother wavelet is applied to a chronological sequence of current measurements (80) of a current through a lead, to obtain first wavelet coefficients. In addition, a second wavelet transformation with a second mother wavelet different from the first mother wavelet is applied to the chronological sequence in order to obtain second wavelet coefficients. On the basis of the first wavelet coefficients and the second wavelet coefficients, it is then determined whether an arc (10; 11; 24) is present.

公开(公告)号：US20220252679A1

公开(公告)日：2022-08-11

申请号：US17589751

申请日：2022-01-31

Applicant: Infineon Technologies AG

Inventor： Felix Kaiser ,  Christoph Grund ,  Goran Keser ,  Christopher Roemmelmayer

IPC: G01R31/52

Abstract: Methods and devices for detecting electrical arcs are provided. A first wavelet transformation with a first mother wavelet is applied to a chronological sequence of current measurements (80) of a current through a lead, to obtain first wavelet coefficients. In addition, a second wavelet transformation with a second mother wavelet different from the first mother wavelet is applied to the chronological sequence in order to obtain second wavelet coefficients. On the basis of the first wavelet coefficients and the second wavelet coefficients, it is then determined whether an arc (10; 11; 24) is present.