公开(公告)号：US20240103072A1

公开(公告)日：2024-03-28

申请号：US17952017

申请日：2022-09-23

Applicant: Intel Corporation

Inventor： Patrick PARDY ,  Kimberlee CELIO ,  Sanchari SEN ,  May Ling OH ,  Shuai ZHAO ,  Joshua W. KEVEK ,  Evgeny Gregory NISENBOIM ,  Amir RAVEH ,  Boris SIMKHOVICH ,  Charles A. PETERSON ,  Kevin JOHNSON ,  Martin Eric Gostasson VON HAARTMAN ,  Eli ABU AYOB ,  Xianghong TONG

IPC: G01R31/302

CPC classification number: G01R31/302

Abstract: Embodiments described herein may be related to apparatuses, processes, systems, and/or techniques for using x-rays to alter or observe circuits within a semiconductor device before, during or after a test of the semiconductor device. Other embodiments may be described and/or claimed.