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    SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INSPECTION APPARATUS
    2.
    发明申请
    SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INSPECTION APPARATUS 审中-公开

    公开(公告)号：US20190212252A1

    公开(公告)日：2019-07-11

    申请号：US16336238

    申请日：2017-07-04

    Applicant: HAMAMATSU PHOTONICS K.K.

    Inventor： Tomonori NAKAMURA ,  Akihiro OTAKA

    IPC: G01N21/17 ,  G01R31/311 ,  H01L21/66

    CPC classification number: G01N21/1717 ,  G01N21/00 ,  G01N21/17 ,  G01R31/302 ,  G01R31/311 ,  H01L22/10

    Abstract: A semiconductor device inspection method of inspecting a semiconductor device which is an inspection object includes: a step of inputting a stimulation signal to the semiconductor device; a step of acquiring a detection signal based on a reaction of the semiconductor device to which the stimulation signal has been input; a step of generating a first in-phase image and a first quadrature image including amplitude information and phase information in the detection signal based on the detection signal and a reference signal generated based on the stimulation signal; and a step of performing, a filtering process of reducing noise on at least one of the first in-phase image and the first quadrature image and then generating a first amplitude image based on the first in-phase image and the first quadrature image.

    Digital test system
    3.
    发明授权
    Digital test system 有权
    数字测试系统

    公开(公告)号：US09431133B2

    公开(公告)日：2016-08-30

    申请号：US13908470

    申请日：2013-06-03

    Applicant: Matthew Gadlage ,  Adam Duncan

    Inventor： Matthew Gadlage ,  Adam Duncan

    IPC: G01R31/26 ,  G11C29/56 ,  G01R31/319 ,  G11C11/412 ,  G11C29/50

    CPC classification number: G01R31/303 ,  G01R31/302 ,  G01R31/31725 ,  G01R31/31907 ,  G06F13/36 ,  G06F13/4068 ,  G06F13/4282 ,  G11C11/4125 ,  G11C29/56 ,  G11C2029/5002

    Abstract: A highly flexible, compact, lightweight, and portable testing system for use with radiation testing activities. The testing system is coupled to a device under test (DUT), which can be positioned in such a way that the top of the die package is exposed to the direct ion beam during radiation testing. A variety of sensors, onboard memory systems, programmable interfaces, onboard control systems, data output devices, and different types of interfaces are also provided which provide an ability to perform testing procedures while having a maximum ability to orient the DUT and perform a wide variety of testing currently unavailable.

    Abstract translation: 高度灵活，紧凑，重量轻且便于携带的测试系统，用于辐射测试活动。 测试系统耦合到被测设备（DUT），其可以以这样的方式定位，使得在辐射测试期间，芯片封装的顶部暴露于直接离子束。 还提供了各种传感器，板载存储器系统，可编程接口，车载控制系统，数据输出设备和不同类型的接口，其提供执行测试程序的能力，同时具有定向DUT并且执行多种多样的最大能力 的测试目前无法使用。

    Pass through device for non-contact voltage detectors
    4.
    发明授权
    Pass through device for non-contact voltage detectors 有权
    通过非接触式电压检测器的设备

    公开(公告)号：US08779752B2

    公开(公告)日：2014-07-15

    申请号：US13298669

    申请日：2011-11-17

    Applicant: Philip Brown Allen, Jr.

    Inventor： Philip Brown Allen, Jr.

    IPC: G01R19/00 ,  G01R31/302 ,  G01R15/16 ,  G01R19/155

    CPC classification number: G01R15/16 ,  G01R19/0084 ,  G01R19/155 ,  G01R31/302

    Abstract: A device for allowing an electrical worker to use a non-contact voltage detector to check for the presence or absence of voltage inside a closed electrical panel is provided. The device includes an assembly having a front side and an opposite back side, a plurality of posts extending outwardly from the back side of and configured to hold wires in a fixed position within the closed electrical panel, and a plurality of indentations in the front side which form protrusions on the back side and are positioned to allow for positioning the non-contact voltage detector proximate the wires for testing with the non-contact voltage detector.

    Abstract translation: 提供一种用于允许电工人使用非接触电压检测器来检查封闭电气面板内部是否存在电压的装置。 该装置包括具有前侧和相对后侧的组件，从背面侧向外延伸并构造成将电线保持在闭合电面板内的固定位置的多个柱，以及在前侧的多个凹陷 其在后侧形成突起并且被定位成允许将非接触电压检测器靠近导线定位以用非接触电压检测器进行测试。

    PASS THROUGH DEVICE FOR NON-CONTACT VOLTAGE DETECTORS
    5.
    发明申请
    PASS THROUGH DEVICE FOR NON-CONTACT VOLTAGE DETECTORS 有权
    通过非接触式电压检测器的器件通过

    公开(公告)号：US20130127440A1

    公开(公告)日：2013-05-23

    申请号：US13298669

    申请日：2011-11-17

    Applicant: Philip Brown Allen, JR.

    Inventor： Philip Brown Allen, JR.

    IPC: G01R19/00

    CPC classification number: G01R15/16 ,  G01R19/0084 ,  G01R19/155 ,  G01R31/302

    Abstract: A device for allowing an electrical worker to use a non-contact voltage detector to check for the presence or absence of voltage inside a closed electrical panel is provided. The device includes an assembly having a front side and an opposite back side, a plurality of posts extending outwardly from the back side of and configured to hold wires in a fixed position within the closed electrical panel, and a plurality of indentations in the front side which form protrusions on the back side and are positioned to allow for positioning the non-contact voltage detector proximate the wires for testing with the non-contact voltage detector.

    Abstract translation: 提供一种用于允许电工人使用非接触电压检测器来检查封闭电气面板内部是否存在电压的装置。 该装置包括具有前侧和相对后侧的组件，从背面侧向外延伸并构造成将电线保持在闭合电面板内的固定位置的多个柱，以及在前侧的多个凹陷 其在后侧形成突起并且被定位成允许将非接触电压检测器靠近导线定位以用非接触电压检测器进行测试。

    ADVANCE MANUFACTURING MONITORING AND DIAGNOSTIC TOOL
    7.
    发明申请
    ADVANCE MANUFACTURING MONITORING AND DIAGNOSTIC TOOL 有权
    高级制造监控和诊断工具

    公开(公告)号：US20100123453A1

    公开(公告)日：2010-05-20

    申请号：US12551635

    申请日：2009-09-01

    Applicant: GERALD WILLIAM PAULY ,  Walter John Keller, III

    Inventor： GERALD WILLIAM PAULY ,  Walter John Keller, III

    IPC: G01R19/00

    CPC classification number: G01S7/41 ,  G01R29/0871 ,  G01R31/01 ,  G01R31/26 ,  G01R31/2642 ,  G01R31/265 ,  G01R31/2851 ,  G01R31/2894 ,  G01R31/302 ,  G01R31/31703

    Abstract: The current invention relates to a monitoring and analysis device and a method for monitoring and analysis that utilizes the unintended electromagnetic emissions of electrically powered systems. The present invention monitors electrical devices by taking detailed measurements of the electromagnetic fields emitted by any component or system utilizing electricity. The measurements will be analyzed to both record a baseline score for future measurements and to be used in detailed analysis to determine the status of the analyzed system or component.

    Abstract translation: 本发明涉及利用电力系统的非预期电磁辐射的监测和分析装置以及监测和分析方法。 本发明通过对利用电力的任何部件或系统发射的电磁场的详细测量来监测电气装置。 将分析测量结果，以记录未来测量的基线分数，并用于详细分析以确定分析的系统或组件的状态。

    Reference equipment for testing contactless payment devices
    8.
    发明授权
    Reference equipment for testing contactless payment devices 失效
    用于测试非接触支付设备的参考设备

    公开(公告)号：US07431217B2

    公开(公告)日：2008-10-07

    申请号：US11182357

    申请日：2005-07-15

    Applicant: Patrick Smets ,  Eddy Lodewijk Hortensia Van De Velde ,  Duncan Garrett

    Inventor： Patrick Smets ,  Eddy Lodewijk Hortensia Van De Velde ,  Duncan Garrett

    IPC: G06K19/05

    CPC classification number: G01R31/308 ,  G01R31/302 ,  G06K7/00 ,  G06K7/0008 ,  G06K7/0095 ,  G06K7/10019 ,  G06K7/10336 ,  G06K7/10465 ,  G06K17/00 ,  G06Q20/32 ,  G06Q20/327 ,  G06Q20/341 ,  G07F7/084 ,  G07F7/1008

    Abstract: Reference equipment including a reference card and a reference reader is provided for testing electronic payment devices such as cards and card readers. The reference equipment is designed to simulate the external behavior of a variety of payment devices that are currently or expected to be deployed in electronic payment systems. Further, the reference equipment is configured to subject devices under test to extreme behaviors which are expected in field use or which are representative of a large class of payment devices. The external behaviors may relate to functional parameters, for example, power consumption, resonance frequency, Q-factor, modulation depth, noise, and timing. Exemplary reference devices are configured to exhibit representative external behavior, which is an empirically determined average behavior of the product devices in the field. Use of the reference equipment for product specification compliance testing will enhance the interoperability of product payment devices.

    Abstract translation: 提供包括参考卡和参考读取器的参考设备用于测试卡和读卡器等电子支付设备。 参考设备旨在模拟目前或预期部署在电子支付系统中的各种支付设备的外部行为。 此外，参考设备被配置为使被测设备受到现场使用期望的或者代表大类支付设备的极端行为。 外部行为可能与功能参数有关，例如功耗，谐振频率，Q因子，调制深度，噪声和时序。 示例性参考装置被配置为表现出代表性的外部行为，其是本领域中产品装置的经验确定的平均行为。 使用参考设备进行产品规格一致性测试将增强产品支付设备的互操作性。

    Line short localization in LCD pixel arrays
    10.
    发明授权
    Line short localization in LCD pixel arrays 有权
    LCD像素阵列的线路短路定位

    公开(公告)号：US07317325B2

    公开(公告)日：2008-01-08

    申请号：US11290932

    申请日：2005-11-29

    Applicant: Matthias Brunner ,  Young Seop Ko

    Inventor： Matthias Brunner ,  Young Seop Ko

    IPC: G01R31/00

    CPC classification number: G09G3/006 ,  G01R31/2853 ,  G01R31/302 ,  G09G3/3648

    Abstract: A method and apparatus for identifying a location of a short between two or more signal lines on a substrate having a plurality of thin film transistors and a plurality of pixels associated with the thin film transistors. The method includes locating the two or more signal lines having the short, locating one or more defective pixels disposed between the two or more signal lines having the short, and identifying the defective pixels as the location of the short.

    Abstract translation: 一种用于识别具有多个薄膜晶体管和与该薄膜晶体管相关联的多个像素的衬底上的两条或更多条信号线之间的短路位置的方法和装置。 该方法包括定位两条或更多条信号线，该信号线具有设置在具有短路的两条或多条信号线之间的一个或多个缺陷像素，并且识别缺陷像素作为短路的位置。

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