公开(公告)号：US20240402251A1

公开(公告)日：2024-12-05

申请号：US18326039

申请日：2023-05-31

Applicant: Intel Corporation

Inventor： Aryeh FARBER ,  Evgeny SHUMAKER ,  Samer ARRAM ,  Dana Shalala YETIV ,  Nir GERON ,  Gil HOROVITZ

IPC: G01R31/319 ,  G01R31/3193

Abstract: A mixed-signal circuit may include an analog circuit and a digital circuit coupled to the analog circuit, wherein the analog circuit is configured to, in a normal operation mode, provide an analog signal to the digital circuit, and wherein the digital circuit is configured to, in the normal operation mode, provide a digital signal to the analog circuit, the mixed-signal circuit may further include a test signal generator configured to, during a test operation mode, receive the digital signal from the digital circuit, generate a test signal based on the digital signal, and provide the test signal to the digital circuit, wherein the test signal generator is configured to generate the test signal using an emulation of the analog circuit, and wherein the mixed-signal circuit is tested based on an output of the digital circuit that is generated in response to the test signal.