公开(公告)号：US10593054B2

公开(公告)日：2020-03-17

申请号：US15199045

申请日：2016-06-30

Applicant: Intel Corporation

Inventor： Ouriel Barzilay ,  Jonathan Abramson

IPC: G06T7/536 ,  G06T7/557 ,  G06T7/143 ,  G06T7/521

Abstract: An apparatus for an electronic measurement using a single image is described herein. The apparatus includes a surface fitting mechanism that is to estimate the analytical model of a surface on which lies the point of the single image and a ray casting unit that is to cast a virtual ray at the selected point that intersects the surface. The apparatus also includes a computing unit to compute a least one three-dimensional location for the selected point based on the intersection of the virtual ray and the plane.

公开(公告)号：US20180005399A1

公开(公告)日：2018-01-04

申请号：US15199045

申请日：2016-06-30

Applicant: Intel Corporation

Inventor： Ouriel Barzilay ,  Jonathan Abramson

IPC: G06T7/536 ,  G06T7/557 ,  G06T15/00

CPC classification number: G06T7/536 ,  G06T7/143 ,  G06T7/521 ,  G06T7/557 ,  G06T2207/10024 ,  G06T2207/10028

Abstract: An apparatus for an electronic measurement using a single image is described herein. The apparatus includes a surface fitting mechanism that is to estimate the analytical model of a surface on which lies the point of the single image and a ray casting unit that is to cast a virtual ray at the selected point that intersects the surface. The apparatus also includes a computing unit to compute a least one three-dimensional location for the selected point based on the intersection of the virtual ray and the plane.