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公开(公告)号：US20160187122A1
公开(公告)日：2016-06-30
申请号：US14583272
申请日：2014-12-26
Applicant: Intel Corporation
Inventor： Yuri I. Krimon , David I. Poisner , Reinhard R. Steffens
CPC classification number: G01B11/16 , G01L1/24 , G06F1/1626 , G06F1/1652 , G06F1/1656 , G06F1/1684 , G08B21/187
Abstract: Systems and methods may provide for determining an amount of physical bend in an electronic device and comparing the amount of physical bend to a threshold. Additionally, a warning may be generated if the amount of physical bend exceeds the threshold. In one example, one or more values representing the amount of physical bend are stored to a nonvolatile memory on the device and retrieved in accordance with one or more of a diagnostic push event or a diagnostic pull event.
Abstract translation: 系统和方法可以提供用于确定电子设备中的物理弯曲量并将物理弯曲量与阈值进行比较。 另外，如果物理弯曲量超过阈值，则可能产生警告。 在一个示例中，表示物理弯曲量的一个或多个值被存储在设备上的非易失性存储器中，并根据诊断推送事件或诊断拉动事件中的一个或多个来检索。
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公开(公告)号：US10371505B2
公开(公告)日：2019-08-06
申请号：US15715794
申请日：2017-09-26
Applicant: Intel Corporation
Inventor： Yuri I. Krimon , David I. Poisner , Reinhard R. Steffens
Abstract: Systems and methods may provide for determining an amount of physical bend in an electronic device and comparing the amount of physical bend to a threshold. Additionally, a warning may be generated if the amount of physical bend exceeds the threshold. In one example, one or more values representing the amount of physical bend are stored to a nonvolatile memory on the device and retrieved in accordance with one or more of a diagnostic push event or a diagnostic pull event.
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公开(公告)号：US20180017377A1
公开(公告)日：2018-01-18
申请号：US15715794
申请日：2017-09-26
Applicant: Intel Corporation
Inventor： Yuri I. Krimon , David I. Poisner , Reinhard R. Steffens
CPC classification number: G01B11/16 , G01L1/24 , G06F1/1626 , G06F1/1652 , G06F1/1656 , G06F1/1684 , G08B21/187
Abstract: Systems and methods may provide for determining an amount of physical bend in an electronic device and comparing the amount of physical bend to a threshold. Additionally, a warning may be generated if the amount of physical bend exceeds the threshold. In one example, one or more values representing the amount of physical bend are stored to a nonvolatile memory on the device and retrieved in accordance with one or more of a diagnostic push event or a diagnostic pull event.
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Patent Agency Ranking
公开(公告)号：US10921116B2
公开(公告)日：2021-02-16
申请号：US16532392
申请日：2019-08-05
Applicant: Intel Corporation
Inventor： Yuri I. Krimon , David I. Poisner , Reinhard R. Steffens
Abstract: Systems and methods may provide for determining an amount of physical bend in an electronic device and comparing the amount of physical bend to a threshold. Additionally, a warning may be generated if the amount of physical bend exceeds the threshold. In one example, one or more values representing the amount of physical bend are stored to a nonvolatile memory on the device and retrieved in accordance with one or more of a diagnostic push event or a diagnostic pull event.
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公开(公告)号：US09013207B2
公开(公告)日：2015-04-21
申请号：US13728772
申请日：2012-12-27
Applicant: Intel Corporation
Inventor： Yuri I. Krimon , David I. Poisner , Reinhard R. Steffens
IPC: H03K19/00 , H03K19/003
CPC classification number: H03K19/003
Abstract: In some embodiments, provided is a processor chip including self deactivation logic to deactivate the processor chip after a threshold of qualified events have been monitored.
Abstract translation: 在一些实施例中，提供了包括自动停用逻辑的处理器芯片，以在监视了合格事件阈值之后停用处理器芯片。
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公开(公告)号：US11506482B2
公开(公告)日：2022-11-22
申请号：US17176114
申请日：2021-02-15
Applicant: Intel Corporation
Inventor： Yuri I. Krimon , David I. Poisner , Reinhard R. Steffens
Abstract: Systems and methods may provide for determining an amount of physical bend in an electronic device and comparing the amount of physical bend to a threshold. Additionally, a warning may be generated if the amount of physical bend exceeds the threshold. In one example, one or more values representing the amount of physical bend are stored to a nonvolatile memory on the device and retrieved in accordance with one or more of a diagnostic push event or a diagnostic pull event.
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公开(公告)号：US20210164775A1
公开(公告)日：2021-06-03
申请号：US17176114
申请日：2021-02-15
Applicant: Intel Corporation
Inventor： Yuri I. Krimon , David I. Poisner , Reinhard R. Steffens
Abstract: Systems and methods may provide for determining an amount of physical bend in an electronic device and comparing the amount of physical bend to a threshold. Additionally, a warning may be generated if the amount of physical bend exceeds the threshold. In one example, one or more values representing the amount of physical bend are stored to a nonvolatile memory on the device and retrieved in accordance with one or more of a diagnostic push event or a diagnostic pull event.
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公开(公告)号：US09772180B2
公开(公告)日：2017-09-26
申请号：US14583272
申请日：2014-12-26
Applicant: Intel Corporation
Inventor： Yuri I. Krimon , David I. Poisner , Reinhard R. Steffens
CPC classification number: G01B11/16 , G01L1/24 , G06F1/1626 , G06F1/1652 , G06F1/1656 , G06F1/1684 , G08B21/187
Abstract: Systems and methods may provide for determining an amount of physical bend in an electronic device and comparing the amount of physical bend to a threshold. Additionally, a warning may be generated if the amount of physical bend exceeds the threshold. In one example, one or more values representing the amount of physical bend are stored to a nonvolatile memory on the device and retrieved in accordance with one or more of a diagnostic push event or a diagnostic pull event.
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