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公开(公告)号：US20240113888A1
公开(公告)日：2024-04-04
申请号：US17936049
申请日：2022-09-28
Applicant: Intel Corporation
Inventor： ZACHARY PEPIN , SANTOSH GHOSH , MANOJ SASTRY
IPC: H04L9/32
CPC classification number: H04L9/3247 , H04L9/3271
Abstract: In one example an apparatus comprises processing circuitry to measure a statistical distance between a marginal distribution of a coordinate of a potential signature (z) over a first interval and a uniform distribution over the first interval and use the statistical distance to determine one or more thresholds of a rejection sampling operation in a lattice-based digital signature algorithm. Other examples may be described.
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