公开(公告)号：US10753889B2

公开(公告)日：2020-08-25

申请号：US16189004

申请日：2018-11-13

申请人： Inter-University Research Institute Corporation High Energy Accelerator Research Organization

发明人： Ken'ichi Kimijima ,  Masao Kimura ,  Daiji Asahara ,  Yasuhiro Onishi

IPC分类号： G01N23/20033 ,  G01N23/2055 ,  G01N23/085

摘要： Provided are a cell for X-ray analysis and an X-ray analysis apparatus that enable simultaneous X-ray diffraction and X-ray absorption fine structure measurements of a material (sample) in the same field of view on the sample (same position on the sample). The cell for X-ray analysis of the present invention enables simultaneous X-ray diffraction and X-ray absorption fine structure measurements of a sample in the same field of view on the sample and includes a furnace including a space where the sample is held and a focused heater heating the sample, a first window provided to the furnace and through which X-rays directed at the sample is incident, a second window provided to the furnace and from which X-rays emerging from the sample exit, a third window provided to the furnace, and a holder that positions the sample in the space. The cell for X-ray analysis makes it possible to simultaneously measure X-ray diffraction of the sample at outside of the second window and X-ray absorption fine structure of the sample through the third window.

公开(公告)号：US20190145915A1

公开(公告)日：2019-05-16

申请号：US16189004

申请日：2018-11-13

申请人： Inter-University Research Institute Corporation High Energy Accelerator Research Organization

发明人： Ken'ichi Kimijima ,  Masao Kimura ,  Daiji Asahara ,  Yasuhiro Onishi

IPC分类号： G01N23/20033 ,  G01N23/085 ,  G01N23/2055

CPC分类号： G01N23/20033 ,  G01N23/085 ,  G01N23/2055

摘要： Provided are a cell for X-ray analysis and an X-ray analysis apparatus that enable simultaneous X-ray diffraction and X-ray absorption fine structure measurements of a material (sample) in the same field of view on the sample (same position on the sample). The cell for X-ray analysis of the present invention enables simultaneous X-ray diffraction and X-ray absorption fine structure measurements of a sample in the same field of view on the sample and includes a furnace including a space where the sample is held and a focused heater heating the sample, a first window provided to the furnace and through which X-rays directed at the sample is incident, a second window provided to the furnace and from which X-rays emerging from the sample exit, a third window provided to the furnace, and a holder that positions the sample in the space. The cell for X-ray analysis makes it possible to simultaneously measure X-ray diffraction of the sample at outside of the second window and X-ray absorption fine structure of the sample through the third window.