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公开(公告)号：US10768124B2
公开(公告)日：2020-09-08
申请号：US16359574
申请日：2019-03-20
发明人： Hiroya Miyazaki
IPC分类号： G01N23/20033 , H01J37/26 , H01J37/20
摘要： In at least one embodiment, a specimen holder includes a specimen holder shaft unit having a specimen and/or specimen mesh setting unit, an outer tubular unit capable of housing the specimen holder shaft unit, a thermal drift adjusting unit made of a material having a different thermal expansion coefficient from a thermal expansion coefficient of the specimen holder shaft unit and partially in contact with the specimen holder shaft unit, and a control mechanism which controls movement of the thermal drift adjusting unit toward a center direction of a specimen.
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公开(公告)号：US10753889B2
公开(公告)日：2020-08-25
申请号：US16189004
申请日：2018-11-13
IPC分类号： G01N23/20033 , G01N23/2055 , G01N23/085
摘要： Provided are a cell for X-ray analysis and an X-ray analysis apparatus that enable simultaneous X-ray diffraction and X-ray absorption fine structure measurements of a material (sample) in the same field of view on the sample (same position on the sample). The cell for X-ray analysis of the present invention enables simultaneous X-ray diffraction and X-ray absorption fine structure measurements of a sample in the same field of view on the sample and includes a furnace including a space where the sample is held and a focused heater heating the sample, a first window provided to the furnace and through which X-rays directed at the sample is incident, a second window provided to the furnace and from which X-rays emerging from the sample exit, a third window provided to the furnace, and a holder that positions the sample in the space. The cell for X-ray analysis makes it possible to simultaneously measure X-ray diffraction of the sample at outside of the second window and X-ray absorption fine structure of the sample through the third window.
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公开(公告)号：US10241015B2
公开(公告)日：2019-03-26
申请号：US15657988
申请日：2017-07-24
申请人： Mitegen, LLC
发明人： Stephen Hollabaugh , Robert Newman , David Closs
IPC分类号： F16H1/28 , G01N1/42 , F16H57/08 , G01N23/20033 , G01N35/02 , F16H57/12 , F25D3/11 , A01N1/02 , F25B19/00 , G01N35/04
摘要： A method and a cryogenic sample positioning system are provided which include: a sample holder cassette that is vertically coupled to a carousel gear through a first shaft. Each sample holder cassette has a first degree of rotation about the first shaft. A first planet drive gear underlies and is vertically coupled to the carousel gear through a second shaft that extends from the carousel gear through the first planet drive gear. The carousel gear has a second degree of rotation about the second shaft that is different from the first degree of rotation. A planet gear that is laterally connected to a second planet drive gear is interposed between each of the carousel gear and the first planet drive gear. Each of the planet gear and the second planet drive gear selectively define the first degree of rotation, without affecting the second degree of rotation of the carousel gear.
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公开(公告)号：US20220146441A1
公开(公告)日：2022-05-12
申请号：US17435801
申请日：2020-03-06
申请人： MITEGEN, LLC
发明人： Robert E. Thorne , David Closs , Benjamin Apker
IPC分类号： G01N23/20033
摘要： A fixed target sample holder for serial synchrotron crystallography comprising a goniometer compatible base, a carrier, a sample holding insert which can be placed into the carrier. The sample holding insert comprising fiducials and windows, wherein each of the windows are respectively configured to accept a sample. The windows can also have holes and texture within each window. Additionally, a sample loading workstation for loading crystals into the sample holder and the removal of excess liquid from the sample, comprising a humidity-controlled chamber, a sample support within the chamber, a capture to place the goniometer-compatible base, and a channel in communication with the chamber that allows for the flow of humidified air into the chamber.
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5.发明授权公开(公告)号：US11170968B2
公开(公告)日：2021-11-09
申请号：US17020239
申请日：2020-09-14
申请人： Protochips, Inc.
发明人： Franklin Stampley Walden, II , John Damiano, Jr. , Daniel Stephen Gardiner , David P. Nackashi , William Bradford Carpenter
IPC分类号： H01J37/20 , H01J37/26 , H01J37/32 , H01J49/04 , G01N1/28 , H01J37/34 , G02B21/32 , G02B21/34 , G01N25/48 , G01N23/20033 , G01N35/00
摘要： A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.
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公开(公告)号：US20210109043A1
公开(公告)日：2021-04-15
申请号：US16498823
申请日：2018-03-29
IPC分类号： G01N23/207 , G01N23/20016 , G01N23/20033
摘要： A device keeps an electrochemical cell under current and at operating temperature during an X-ray beam diffraction analysis of a first electrode, the cell comprising a solid electrolyte interposed between the electrodes. The device comprises: first and second interconnectors having contact faces contacting the electrodes, which allow a gas flow and exchange between the interconnectors and the electrodes. The contact face of the first interconnector allows an X-ray beam to pass to the first electrode. A thermal and atmospheric containment chamber has an inner cavity housing a stack formed from the cell between the interconnectors and a cover closing the cavity, provided with a window allowing X-rays to pass through, the first interconnector being intended to be arranged facing the cover. The contact face of each interconnector is a slotted element; slotted portions of the slotted element are uniformly arranged and form 30% to 80% of the element's surface area.
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7.发明授权公开(公告)号：US10948433B2
公开(公告)日：2021-03-16
申请号：US16630879
申请日：2018-09-04
发明人： Armin Kriele
IPC分类号： G01N23/20033 , H01M10/613 , H01M10/615 , H01M10/63 , H01M10/647 , H01M10/6572 , H01M10/0525 , H01M10/42
摘要： The invention relates to an apparatus (1) for clamping flat samples (6), in particular pouch battery cells, for x-ray diffractometry, wherein the apparatus has a housing (2) having a sample holder (4), which has holding elements (5) that are able to be tensioned in relation to one another for clamping the sample (6), at least two x-ray windows (11a, 11b, 12) for letting in and out x-rays, and at least one first temperature control device (7) for controlling the temperature of the sample (6). At least one first temperature control device (7) is in each case attached to the holding elements (5), wherein the first temperature control devices (7) are thermally coupled to the housing (2), and the apparatus has at least one second temperature control device (9), which is configured to dissipate heat, which is output by the first temperature control device (7) to the housing (2), out of the housing (3) to the outside and/or to introduce heat from the outside into the housing (2).
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公开(公告)号：US11774379B2
公开(公告)日：2023-10-03
申请号：US17295862
申请日：2019-11-21
申请人： Rigaku Corporation
发明人： Takashi Sato
IPC分类号： G01N23/20 , G01N1/28 , G01N23/20033 , G01N23/20025 , G01N23/207
CPC分类号： G01N23/20033 , G01N1/28 , G01N23/20025 , G01N23/207
摘要： It is made possible to surely supply a porous complex crystal in which a sample is soaked, into a single-crystal X-ray structure analysis apparatus. There is provided a soaking machine for soaking a sample, comprising a supply section that supplies the sample to the porous complex crystal held by a sample holder 310, a temperature control section that controls a temperature of the porous complex crystal, a drive section that drives the supply section, and a control section that controls the supply section, the temperature control section and the drive section. The supply section supplies the sample to the porous complex crystal held by the sample holder 310 inside the applicator 311; and the temperature control section controls the temperature of the porous complex crystal held by the sample holder 310, inside the applicator 311 into which the sample is supplied.
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公开(公告)号：US20220011248A1
公开(公告)日：2022-01-13
申请号：US17295862
申请日：2019-11-21
申请人： Rigaku Corporation
发明人： Takashi SATO
IPC分类号： G01N23/20033 , G01N1/28
摘要： It is made possible to surely supply a porous complex crystal in which a sample is soaked, into a single-crystal X-ray structure analysis apparatus. There is provided a soaking machine for soaking a sample, comprising a supply section that supplies the sample to the porous complex crystal held by a sample holder 310, a temperature control section that controls a temperature of the porous complex crystal, a drive section that drives the supply section, and a control section that controls the supply section, the temperature control section and the drive section. The supply section supplies the sample to the porous complex crystal held by the sample holder 310 inside the applicator 311; and the temperature control section controls the temperature of the porous complex crystal held by the sample holder 310, inside the applicator 311 into which the sample is supplied.
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公开(公告)号：US11181492B2
公开(公告)日：2021-11-23
申请号：US16498823
申请日：2018-03-29
IPC分类号： G01N23/207 , G01N23/20 , H01M8/12 , G01N23/20016 , G01N23/20033 , C25B1/04 , H01M8/04537
摘要： A device keeps an electrochemical cell under current and at operating temperature during an X-ray beam diffraction analysis of a first electrode, the cell comprising a solid electrolyte interposed between the electrodes. The device comprises: first and second interconnectors having contact faces contacting the electrodes, which allow a gas flow and exchange between the interconnectors and the electrodes. The contact face of the first interconnector allows an X-ray beam to pass to the first electrode. A thermal and atmospheric containment chamber has an inner cavity housing a stack formed from the cell between the interconnectors and a cover closing the cavity, provided with a window allowing X-rays to pass through, the first interconnector being intended to be arranged facing the cover. The contact face of each interconnector is a slotted element; slotted portions of the slotted element are uniformly arranged and form 30% to 80% of the element's surface area.
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