公开(公告)号：US20190340532A1

公开(公告)日：2019-11-07

申请号：US16401585

申请日：2019-05-02

Applicant: IonQ, Inc.

Inventor： Andrew Maps DUCORE ,  Yuensong NAM ,  Omar SHEHAB ,  Matthew Joseph KEESAN ,  Stewart O. ALLEN

IPC: G06N10/00 ,  G06F17/50 ,  G06F8/41

Abstract: The disclosure describes various aspects of quantum computer simulators. In an aspect, a method for characterizing a quantum computer simulator includes identifying simulator processes supported by the quantum computer simulator, generating, for each simulator process, characteristic curves for different gates or quantum operations, the characteristic curves including information for predicting the time it takes to simulate each of the gates or quantum operations in a respective simulator process, and providing the characteristic curves to select one of the simulator processes to simulate a circuit, quantum program, or quantum algorithm that uses at least some of the gates or quantum operations. In another aspect, a method for optimizing simulations in a quantum computer simulator is described where a simulator process is selected for simulation of a circuit, quantum program, or quantum algorithm based on characteristic curves that predict a time it takes for the simulation to be carried out.

公开(公告)号：US20230039901A1

公开(公告)日：2023-02-09

申请号：US17880399

申请日：2022-08-03

Applicant: IonQ, Inc.

Inventor： Kevin Antony LANDSMAN ,  Aleksey BLINOV ,  Shantanu DEBNATH ,  Vandiver CHAPLIN ,  Kristin Marie BECK ,  Andrew Maps DUCORE ,  Melissa JAMESON ,  Jason Hieu Van NGUYEN ,  Felix TRIPIER

IPC: G06N10/40 ,  G06N5/00

Abstract: Techniques to address the problem of having micromotion and stray fields affect trapped ions and the operation of QIP systems based on trapped ions are described. For example, one technique or approach may involve collecting scattered photons off the ions using a resonant or near-resonant oscillating electric field (e.g., a laser beam or a microwave source) with some projection in the axis or direction of micromotion that one wishes to reduce. Another technique or approach may include raising and lowering the trapping potentials to see how the ion position changes. The information collected from these techniques may be used to provide appropriate adjustments. Accordingly, the present disclosure describes methods, scripts, or techniques that minimize the effects of micromotion.