公开(公告)号：US20230129122A1

公开(公告)日：2023-04-27

申请号：US18048268

申请日：2022-10-20

Applicant: IonQ, Inc.

Inventor： Shantanu DEBNATH ,  Vandiver CHAPLIN ,  Kristin M. BECK ,  Melissa JAMESON ,  Jason Hieu Van NGUYEN

IPC: G06N10/70 ,  H03K17/92

Abstract: Aspects of the present disclosure relate generally to systems and methods for use in the implementation and/or operation of quantum information processing (QIP) systems, and more particularly, to techniques for removing or correcting for translation errors between a programmed strength and an applied strength of quantum gates. A method is described that includes determining, for each quantum gate in a quantum operation, a non-linearity between an applied strength of a laser beam used for the respective quantum gate and a programmed strength intended to be applied by the laser beam for the respective quantum gate. The method further includes linearizing the non-linearity for each quantum gate and storing linearization information in memory. Moreover, the method includes applying the linearization information to correct for the non-linearity when implementing each quantum gate as part of the quantum operation. A system is also described that is configured to implement the method described above.

公开(公告)号：US20230039901A1

公开(公告)日：2023-02-09

申请号：US17880399

申请日：2022-08-03

Applicant: IonQ, Inc.

Inventor： Kevin Antony LANDSMAN ,  Aleksey BLINOV ,  Shantanu DEBNATH ,  Vandiver CHAPLIN ,  Kristin Marie BECK ,  Andrew Maps DUCORE ,  Melissa JAMESON ,  Jason Hieu Van NGUYEN ,  Felix TRIPIER

IPC: G06N10/40 ,  G06N5/00

Abstract: Techniques to address the problem of having micromotion and stray fields affect trapped ions and the operation of QIP systems based on trapped ions are described. For example, one technique or approach may involve collecting scattered photons off the ions using a resonant or near-resonant oscillating electric field (e.g., a laser beam or a microwave source) with some projection in the axis or direction of micromotion that one wishes to reduce. Another technique or approach may include raising and lowering the trapping potentials to see how the ion position changes. The information collected from these techniques may be used to provide appropriate adjustments. Accordingly, the present disclosure describes methods, scripts, or techniques that minimize the effects of micromotion.