Method and device for tunnel microscopy
    1.
    发明授权
    Method and device for tunnel microscopy 有权
    隧道显微镜的方法和装置

    公开(公告)号:US06476386B1

    公开(公告)日:2002-11-05

    申请号:US09532555

    申请日:2000-03-22

    Abstract: In a method for scanning microscopy, for which the surface of a sample is scanned point-by-point using a tunnel tip and locally resolved tunnel current measurement is performed, during scanning the tunnel tip is remagnetized by a predetermined remagnetization frequency, and from the tunnel current (It) or a z coordinate of the distance between the tunnel tip and the sample or a value derived from this, locally resolved signal components are derived, occurring at the remagnetization frequency and being characteristic for magnetic sample properties, whereby on the basis of the derived signal components an imaging of the magnetic structure of the sample surface is performed.

    Abstract translation: 在扫描显微术的方法中,使用隧道尖端逐点扫描样品的表面并进行局部分辨的隧道电流测量,在扫描期间,隧道尖端被预定的再磁化频率再次磁化,并且从 隧道电流(It)或隧道尖端与样品之间距离的z坐标或由此导出的值,导出局部解析的信号分量,出现在再磁化频率处,并且是磁性样品特性的特征, 导出的信号分量是对样品表面的磁性结构的成像。

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