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公开(公告)号:US10976267B2
公开(公告)日:2021-04-13
申请号:US15500629
申请日:2015-07-30
Applicant: JAPAN SCIENCE AND TECHNOLOGY AGENCY
Inventor: Makoto Fujita , Yasuhide Inokuma , Kentaro Yamaguchi
IPC: C30B7/08 , G01N23/20 , G01N23/205
Abstract: The present invention is a method for analyzing diffraction data obtained using a crystal structure analysis sample, the sample comprising a single crystal of a porous compound, and a compound for which a structure is to be determined. The method comprising: a step (I) that selects a space group that is identical to a space group of the single crystal of the porous compound, or a space group that has a symmetry lower than that, to be a space group of the crystal structure analysis sample; a step (II) that determines an initial structure of the crystal structure analysis sample using diffraction data with respect to a crystal structure of the single crystal of the porous compound as initial values; and a step (III) that refines the initial structure determined.
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公开(公告)号:US20170219500A1
公开(公告)日:2017-08-03
申请号:US15500629
申请日:2015-07-30
Applicant: JAPAN SCIENCE AND TECHNOLOGY AGENCY
Inventor: Makoto Fujita , Yasuhide Inokuma , Kentaro Yamaguchi
IPC: G01N23/20
CPC classification number: G01N23/20 , G01N23/205
Abstract: The present invention is a method for analyzing diffraction data obtained using a crystal structure analysis sample, the sample comprising a single crystal of a porous compound, and a compound for which a structure is to be determined. The method comprising: a step (I) that selects a space group that is identical to a space group of the single crystal of the porous compound, or a space group that has a symmetry lower than that, to be a space group of the crystal structure analysis sample; a step (II) that determines an initial structure of the crystal structure analysis sample using diffraction data with respect to a crystal structure of the single crystal of the porous compound as initial values; and a step (III) that refines the initial structure determined.
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