公开(公告)号：US20020167724A1

公开(公告)日：2002-11-14

申请号：US10103190

申请日：2002-03-21

Applicant: JAPAN SCIENCE AND TECHNOLOGY CORPORATION

Inventor： Yoshinori Iketaki ,  Masaaki Fujii ,  Takashige Omatsu ,  Kimihisa Yamamoto ,  Toshio Suzuki

IPC: G02B001/00

CPC classification number: G02B21/06

Abstract: A microscope includes a first light source to emit a first light to excite a molecule of a sample to a higher energy level vibration state which belongs to a lowest energy level electron state from the ground state, a second light source to emit a second light source to excite the molecule to a higher energy level quantum state from the higher energy vibration state, an optical system to overlap the first light and the second light partially on the sample, and an optical detector to detect a given fluorescence from the irradiated region of the first light and the second light on the sample.

Abstract translation: 显微镜包括：第一光源，用于发射第一光以将样品的分子激发到属于基本状态的最低能量级电子态的较高能级振动状态，第二光源发射第二光源 从更高的能量振动状态激发分子到更高的能量级量子态，光学系统将部分地与样品上的第一光和第二光重叠，以及光学检测器，用于检测来自辐射源的照射区域的给定荧光 样品上的第一个光和第二个光。