摘要:
In a device and a method for testing an object for material defects, a multi-emitter x-ray source, at least one x-ray detector and a control system to activate emitters of the multi-emitter x-ray source are thereby used. A selective activation of individual emitters or of a portion of the emitters is conducted according to the requirements of at least one item of information related to the tested object. The Flexible and low-cost materials testing is achieved.