公开(公告)号：US09182424B2

公开(公告)日：2015-11-10

申请号：US13847411

申请日：2013-03-19

Applicant: JF Microtechnology Sdn. Bhd.

Inventor： Foong Wei Kuong ,  Goh Kok Sing ,  Shamal Mundiyath ,  Muhamad Izzat Bin Roslee

IPC: G01R1/067 ,  G01R1/04

CPC classification number: G01R1/067 ,  G01R1/0466 ,  G01R1/0483

Abstract: A chip testing solution having two separate contacts: one to provide current and one to measure voltage. One contact acts as the force and other as sense, and with its unique short wipe stroke technology enables the electrical connection from the contact terminal of the device under test (DUT) to the loadboard without fail even after prolonged insertion/testing of the devices. The two contacts are in close proximity, but electrically isolated from each other. Each contact is made to electrically touch a single conductive lead/pad on the DUT thus forming a test connection. The two contacts; one on front and other on back, wiping on the lead/pads will generally be a “sense” probe, and a “force” used for making a Kelvin connection. The short contact is connected to the loadboard by means of an additional contact known as “interposer” extending through and top of the tall contact base body.

Abstract translation: 具有两个独立触点的芯片测试解决方案：一个提供电流和一个测量电压。 一个接触件作为力而作为感觉，其独特的短擦拭冲程技术使得即使在长时间插入/测试设备之后，也能够从被测设备的接触端子（DUT）到负载板的电气连接。 两个触点非常接近，但彼此电隔离。 使每个触点与DUT上的单个导电引线/焊盘电接触，从而形成测试连接。 两个接触; 一个在前面，另一个在后面，在导线/焊盘上擦拭通常将是一个“感觉”探针，和用于进行开尔文连接的“力”。 短触点通过延伸穿过高接触基体的顶部的称为“插入件”的附加触点连接到装载板。

公开(公告)号：US09658248B2

公开(公告)日：2017-05-23

申请号：US13848209

申请日：2013-03-21

Applicant: JF Microtechnology Sdn. Bhd.

Inventor： Foong Wei Kuong ,  Goh Kok Sing ,  Shamal Mundiyath

IPC: G01R1/067 ,  G01R1/04

CPC classification number: G01R1/067 ,  G01R1/0466

Abstract: A ground electrical contact for an integrated circuit (IC) testing apparatus that comprises: a rigid bottom member having two planar surfaces that slope towards each other, so that the bottom member forms a partial wedge shape with the top end of the wedge being narrower than the bottom end; a flexible top member having two arms extending over said bottom member such that the top member forms an inverted U-shape, said two arms having an inwards bias such that an inner surface of each arm is pressed in contact with each planar surface; and a compressible member located between the narrower end of said bottom member and a bifurcation inner surface, which is an inner surface where the two arms bifurcate in the top member. The bottom member and top member are made of an electrically conductive material.