公开(公告)号：US10031163B2

公开(公告)日：2018-07-24

申请号：US14567867

申请日：2014-12-11

Applicant: JF Microtechnology Sdn. Bhd.

Inventor： Wei Kuong Foong ,  Kok Sing Goh ,  Shamal Mundiyath ,  Eng Kiat Lee

IPC: G01R3/00 ,  G01R1/067 ,  G01R1/073

Abstract: An electrical contact that employs a common compressible layer for all contacts, wherein the compressible layer is fashioned with ducts that contain bridges within them. The bridges are formed of the compressible layer. This bridge serves as a compressible member for a first and second member in electrical contact with each other, and that interact with each other such that a compression force acted on the first and second members will cause them to maintain electrical contact while compressing the bridge. When the compressive force is released, the bridge, acting like a spring, expands thus pushing the first and second members apart, but still in electrical contact with each other.

公开(公告)号：US11696396B2

公开(公告)日：2023-07-04

申请号：US17585363

申请日：2022-01-26

Applicant: JF MICROTECHNOLOGY SDN. BHD

Inventor： Wei Kuong Foong ,  Kok Sing Goh ,  Shamal Mundiyath ,  Eng Kiat Lee ,  Grace Ann Nee Yee

IPC: H05K1/02

CPC classification number: H05K1/0296 ,  H05K1/0268 ,  H05K1/0283 ,  H05K2201/1078 ,  H05K2201/1084 ,  H05K2201/10704 ,  H05K2201/10795

Abstract: An electrical contact assembly that uses an elastomer strip for each row of individual contacts. Each contact comprises a rigid bottom pin and a flexible top pin with a pair of arms which extend over and slide along sloped surfaces of the bottom contact. The elastomer strip is located between rows of the bottom and top pins. A bottom socket housing is provided with grooves which receive each elastomer strip. A row of top pins is then placed over each elastomer strip, and through ducts in the bottom socket housing. Bottom pins are then snapped into place in between the pair of arms.

公开(公告)号：US10826217B2

公开(公告)日：2020-11-03

申请号：US16287834

申请日：2019-02-27

Applicant: JF MICROTECHNOLOGY SDN. BHD.

Inventor： Wei Kuong Foong ,  Kok Sing Goh ,  Shamal Mundiyath ,  Eng Kiat Lee ,  Muhamad Izzat bin Roslee

IPC: H01R13/11 ,  G01R31/28 ,  H01R13/405 ,  H01R13/42 ,  H01R13/426

Abstract: An electrical contact assembly having a pair of contacts mirroring each other, each contact coupled with an elastomer positioned in a recess formed near a lower end of the contact. Each elastomer has a cylindrical shape with the axis of the cylinder running in a front to rear direction. Each elastomer is secured at its front and rear ends by a lower cavity formed within a housing. The contacts are able to rock sideways around their lower ends between uncompressed and compressed states.

公开(公告)号：US10527646B2

公开(公告)日：2020-01-07

申请号：US15438721

申请日：2017-02-21

Applicant: JF MICROTECHNOLOGY SDN. BHD.

Inventor： Wei Kuong Foong ,  Kok Sing Goh ,  Shamal Mundiyath ,  Eng Kiat Lee

IPC: G01R1/04 ,  H01L21/66 ,  H01L23/522 ,  H01L23/528

Abstract: An electrical contact assembly comprised of four identical modules arranged in a four-sided formation. Each module comprises of a bottom housing formed with two rows of through holes to allow a row of front and back contact pairs to be inserted, with separators in between each pair to prevent electrical conductance between the pairs. A top housing is then lowered onto the top of these contact pairs. With the aid of a key tool, the rows of contact pairs are inserted into through holes in the top housing. By virtue of different heights between the front and back rows of through holes, the front and back contact rows are inserted one first, and then the other. This allows for easier installation of an assembly with minimal tolerance accumulation.

公开(公告)号：US20140127953A1

公开(公告)日：2014-05-08

申请号：US14122219

申请日：2011-05-27

Applicant: JF MICROTECHNOLOGY SDN. BHD.

Inventor： Wei Kuong Foong ,  Kok Sing Goh ,  Shamal Mundiyath ,  Eng Kiat Lee

IPC: H01R13/24

CPC classification number: G01R1/0466 ,  G01R1/0483 ,  H01R13/24 ,  H01R13/2407

Abstract: An electrical test contact electrically connects a test terminal of an Integrated Circuit (IC) test assembly with an IC terminal of an IC device in an electrical interconnect assembly. The test contact is formed of electrically conductive material and includes a head portion and a foot portion. The head portion includes a first electrical contacting portion for electrically engaging an IC terminal of an IC device during use, and the foot portion includes a second electrical contacting portion for electrically engaging a test terminal of a test assembly during use. The head portion includes a head receiving portion that receives a first resiliently biasing member to retain the first resiliently biasing member in contact with the test contact. The first resiliently biasing member biases the first electrical contacting portion against the IC terminal of the IC device during use. An electrical interconnect assembly having multiple test contacts is also disclosed.

Abstract translation: 电气测试接点将集成电路（IC）测试组件的测试端子与电气互连组件中的IC器件的IC端子电连接。 测试触点由导电材料形成，并包括头部和脚部。 头部包括用于在使用期间电IC接合IC器件的IC端子的第一电接触部分，并且脚部部分包括用于在使用期间电连接测试组件的测试端子的第二电接触部分。 头部包括头部接收部分，其接收第一弹性偏置构件以将第一弹性偏置构件保持为与测试接触部接触。 第一弹性偏置构件在使用期间将第一电接触部分偏压到IC器件的IC端子。 还公开了一种具有多个测试触点的电互连组件。

公开(公告)号：US11821916B2

公开(公告)日：2023-11-21

申请号：US17710818

申请日：2022-03-31

Applicant: JF MICROTECHNOLOGY SDN. BHD.

Inventor： Wei Kuong Foong ,  Kok Sing Goh ,  Shamal Mundiyath ,  Eng Kiat Lee ,  Fadzhirul Ridhzwan Azry Bin Sulaiman

IPC: G01R1/04 ,  H01R13/24

CPC classification number: G01R1/0466 ,  H01R13/2414

Abstract: An electrical ground connector for use as part of a test connector in an integrated circuit (IC) device testing apparatus having a resilient connector for electrical grounding and comprising a dual elastomer contact stacked vertically above a rigid ground block. The height of the ground block can be adjusted to compensate for the lack of height of the dual elastomer contacts, so that the entire connector has enough height to maintain electrical connection between a load board of the testing apparatus and the IC device.

公开(公告)号：US11674977B2

公开(公告)日：2023-06-13

申请号：US17682769

申请日：2022-02-28

Applicant: JF MICROTECHNOLOGY SDN. BHD

Inventor： Wei Kuong Foong ,  Kok Sing Goh ,  Shamal Mundiyath ,  Eng Kiat Lee ,  Grace Ann Nee Yee

IPC: H05K1/02 ,  G01R1/04 ,  G01R1/073

CPC classification number: G01R1/0466 ,  G01R1/0735 ,  G01R1/07364 ,  H05K1/0268 ,  H05K1/0283 ,  H05K1/0296 ,  H05K2201/1078 ,  H05K2201/1084 ,  H05K2201/10704 ,  H05K2201/10795

Abstract: An electrical contact assembly that uses an elastomer strip for each row of individual contacts. Each contact comprises a rigid bottom pin and a flexible top pin with a pair of arms which extend over and slide along sloped concave surfaces of the bottom contact. The elastomer strip is located between rows of the bottom and top pins. A bottom socket housing is provided with grooves which receive each elastomer strip. A row of top pins is then placed over each elastomer strip, and through ducts in the bottom socket housing. Bottom pins are then snapped into place in between the pair of arms.

公开(公告)号：US10830812B2

公开(公告)日：2020-11-10

申请号：US16115322

申请日：2018-08-28

Applicant: JF MICROTECHNOLOGY SDN. BHD.

Inventor： Wei Kuong Foong ,  Kok Sing Goh ,  Shamal Mundiyath ,  Eng Kiat Lee

IPC: G01R31/28 ,  H01R13/405 ,  H01R13/6461 ,  H01R43/20 ,  H01R43/24 ,  G01R1/067 ,  G01R1/073 ,  H01R13/24 ,  H01R13/504 ,  H01R13/506

Abstract: A manufacturing process for an electrical contact assembly that uses an assembly jig with a middle horizontal lip adapted to fit into a plurality of C-shaped inner contact pins, as well as top and bottom guide teeth that guide top and bottom parts of the inner pins as they are being assembled. An inner holder then covers the inner pins, at which point epoxy is applied, which when cured, secures the inner holder to the plurality of inner pins. Outer contact pins in turn cover the outside of the inner holder, and an outer holder covers the outer contact pins. Epoxy is also applied between the outer holder and outer pins, which when cured, secures the outer holder to the plurality of outer pins. A heat curing process is also employed to assist with the curing of the epoxy, during which a clamp temporarily holds the assembly in place.

公开(公告)号：US10018653B2

公开(公告)日：2018-07-10

申请号：US15422690

申请日：2017-02-02

Applicant: JF MICROTECHNOLOGY SDN. BHD.

Inventor： Wei Kuong Foong ,  Kok Sing Goh ,  Shamal Mundiyath ,  Eng Kiat Lee

IPC: G01R31/20 ,  G01R1/067 ,  G01R1/073 ,  G01R31/28 ,  H01R3/00 ,  H01R101/00 ,  B29C31/00

CPC classification number: G01R1/06727 ,  B29C31/00 ,  G01R1/06722 ,  G01R1/07357 ,  G01R31/2886 ,  H01R3/00 ,  H01R2101/00

Abstract: An electrical Kelvin contact assembly for testing IC testing apparatus that uses an assembly design that reduces the tolerance to a near negligible range. The assembly does not use any screws, dowel pins, adhesives or welding to fasten the electrical contacts to the housing. The design of the assembly uses rows of contacts with specially designed protrusions that sit snugly in openings located on three plate-like layers. These layers contain the contacts in the horizontal plane by securing the protrusions in the opening, as well as in the vertical plane by means of a sandwich between three separate layers. A second contact is slid into back slits formed by the three layers.

公开(公告)号：US11266015B2

公开(公告)日：2022-03-01

申请号：US17344499

申请日：2021-06-10

Applicant: JF MICROTECHNOLOGY SDN. BHD

Inventor： Wei Kuong Foong ,  Kok Sing Goh ,  Shamal Mundiyath ,  Eng Kiat Lee ,  Grace Ann Nee Yee

IPC: H05K1/02

Abstract: An electrical contact assembly that uses an elastomer strip for each row of individual contacts. Each contact comprises a rigid bottom pin and a flexible top pin with a pair of arms which extend over and slide along sloped surfaces of the bottom contact. The elastomer strip is located between rows of the bottom and top pins. A bottom socket housing is provided with grooves which receive each elastomer strip. A row of top pins is then placed over each elastomer strip, and through ducts in the bottom socket housing. Bottom pins are then snapped into place in between the pair of arms.