公开(公告)号：US09121914B2

公开(公告)日：2015-09-01

申请号：US14238227

申请日：2013-02-22

Applicant: JOLED INC.

Inventor： Takayuki Shimamura ,  Yoshiki Hayashida ,  Akinori Shiota ,  Shinya Tsuchida

IPC: G01R31/44 ,  H01L51/56 ,  H01L21/66 ,  H01L51/52 ,  G09G3/32

CPC classification number: G01R31/44 ,  G09G3/3208 ,  H01L22/14 ,  H01L51/5203 ,  H01L51/56 ,  H01L2251/568

Abstract: A defect detection method for an organic EL element having a first electrode, a second electrode, and a functional layer and a light-emission layer disposed between the electrodes, including: applying a first voltage, between the electrodes, that, when the organic EL element includes, between the electrodes, a defective portion that is a potential cause of non-light emission of the light-emission layer, reduces electrical resistance of a first portion, of the functional layer, corresponding to the defective portion and makes the organic EL element detectable as a dark spot, whose light-emission layer does not emit light; and after applying the first voltage, applying a second voltage between the electrodes and detecting whether or not the organic EL element is the dark spot, the second voltage, when the organic EL element does not include the defective portion, causing the light-emission layer to emit light.

Abstract translation: 一种具有第一电极，第二电极和功能层的有机EL元件的缺陷检测方法和设置在电极之间的发光层，包括：在电极之间施加第一电压，当有机EL 在电极之间包括作为发光层的非发光的潜在原因的缺陷部分，降低与缺陷部分相对应的功能层的第一部分的电阻，并使有机EL 元素作为暗点检测，其发光层不发光; 并且在施加第一电压之后，在电极之间施加第二电压并检测有机EL元件是否是暗点，第二电压，当有机EL元件不包括缺陷部分时，使发光层 发光。