公开(公告)号：US10243176B2

公开(公告)日：2019-03-26

申请号：US15513619

申请日：2015-08-06

Applicant: JOLED INC.

Inventor： Yoshiki Hayashida ,  Kazuhiro Kobayashi ,  Toshiaki Onimaru ,  Takayuki Shimamura

IPC: H01L27/32 ,  H01L51/00 ,  H01L51/56

Abstract: A method for repairing a bank during manufacture of an organic EL display device when a bank defect portion is produced due to collapsing of a bank, a foreign particle, or the like. The method includes: detecting a defect portion of a lengthwise bank formed over a ground substrate; and when a defect portion is detected, forming, in each of adjacent concave spaces between which the lengthwise bank having the defect portion is located, a dam partitioning the concave space into a first space in a vicinity of the bank defect portion and a second portion not in the vicinity of the bank defect portion. The shape of the dam is configured so that in ejecting organic functional layer ink in each concave space with a nozzle head, there is an ink dropping point in each of the first space and the second space.

公开(公告)号：US09755193B2

公开(公告)日：2017-09-05

申请号：US15115763

申请日：2015-02-06

Applicant: JOLED INC.

Inventor： Toshiaki Onimaru ,  Takayuki Shimamura ,  Kazuhiro Kobayashi ,  Yoshiki Hayashida ,  Tetsuro Kondoh

IPC: H01L51/56 ,  H01L27/32 ,  H01L51/00

CPC classification number: H01L51/56 ,  H01L27/3246 ,  H01L51/0005 ,  H01L2251/568

Abstract: An examination is performed of whether or not a bank having a defect portion is present. When a bank having a defect portion is present, the bank having the defect portion is repaired by forming a dam in each of adjacent concave spaces between which the bank having the defect portion is located. A dam formed in a concave space partitioning the concave space into a first space in a vicinity of the defect portion and a second space outside the vicinity of the defect portion.

公开(公告)号：US09947738B2

公开(公告)日：2018-04-17

申请号：US14969439

申请日：2015-12-15

Applicant: JOLED INC.

Inventor： Tetsuro Kondoh ,  Toshiaki Onimaru ,  Makoto Kimura ,  Kazuhiro Kobayashi ,  Yoshiki Hayashida

IPC: H01L29/08 ,  H01L27/32

CPC classification number: H01L27/3276 ,  H01L27/3246 ,  H01L27/3262

Abstract: A display panel including: a substrate; a multi-layer wiring layer disposed over the substrate and including a first power line and a second power line; organic electroluminescence elements over the multi-layer wiring layer; a partition wall over the multi-layer wiring layer; and a member over the multi-layer wiring layer, a height of the member from the substrate being greater than a height of the partition wall from the substrate, wherein the multi-layer wiring layer includes a first portion and a second portion, the organic electroluminescence elements are arrayed on the first portion, in the second portion, the first power line and the second power line intersect, and the member is positioned on the second portion without overlapping at least one of the first power line and the second power line in plan view of the substrate.

公开(公告)号：US09837640B2

公开(公告)日：2017-12-05

申请号：US15122716

申请日：2015-02-24

Applicant: JOLED INC.

Inventor： Yoshiki Hayashida ,  Kazuhiro Kobayashi ,  Toshiaki Onimaru ,  Takayuki Shimamura

IPC: H01L51/56 ,  H01L27/32

CPC classification number: H01L51/56 ,  H01L27/3246 ,  H01L2251/303 ,  H01L2251/568

Abstract: A bank repair method for repairing a defect portion of a bank in a process of manufacturing an organic electroluminescence (EL) display device including a substrate, banks formed over the substrate, and light-emitting layers formed in concave spaces defined by the banks. The bank repair method includes: examining whether or not a bank having a defect portion is present; and when a bank having a defect portion is present, repairing the bank by applying a repair material containing a gas adsorbent to the defect portion and curing the repair material; and after curing the repair material, baking the repair material by irradiating the repair material with infrared laser light.

公开(公告)号：US09818809B2

公开(公告)日：2017-11-14

申请号：US15116055

申请日：2015-02-06

Applicant: JOLED INC.

Inventor： Kazuhiro Kobayashi ,  Toshiaki Onimaru ,  Yoshiki Hayashida ,  Takayuki Shimamura

IPC: H01L21/00 ,  H01L29/08 ,  H01L27/32 ,  H01L51/50

CPC classification number: H01L27/3246 ,  H01L27/3283 ,  H01L51/0004 ,  H01L51/5012 ,  H01L2227/323 ,  H01L2251/568

Abstract: An examination is performed of whether or not a bank having a defect portion is present. When a bank having a defect portion is present, the bank having the defect portion is repaired by forming a dam in each of adjacent concave spaces between which the bank having the defect portion is located. A dam formed in a concave space partitions the concave space into a first space in a vicinity of the defect portion and a second space outside the vicinity of the defect portion. The dam, at a portion thereof with lowest height, satisfies (h/H)+0.1W≧1.5, 0.5≦(h/H)≦2.0, and 5≦W≦50, where a ratio of the height h of the dam to a height H of the banks is denoted as h/H, and a width of the dam is denoted as W μm.