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公开(公告)号:US20150285609A1
公开(公告)日:2015-10-08
申请号:US14676067
申请日:2015-04-01
申请人: JTEKT CORPORATION
发明人: Ryo ITO , Naomasa Mukaide
CPC分类号: G01B5/016 , B23Q17/20 , B23Q17/248 , B24B5/04 , B24B49/105 , G01N27/90
摘要: A machine tool including a non-contact affected layer detection sensor capable of detecting an affected layer with high precision is provided. A machine tool includes a non-contact affected layer detection sensor, a main body, probes and that contact the surface of an workpiece, arm portions supported by the main body, and dimension measurement sensors that output a signal that corresponds to the dimension of the workpiece on the basis of displacement of the arm portions with respect to the main body. The affected layer detection sensor is provided in the arm portion, and outputs a signal that corresponds to an affected state of the workpiece. The arm portions hold the probes respectively, and are displaceable with respect to the main body in accordance with the dimension of the workpiece.
摘要翻译: 提供了一种能够高精度地检测受影响层的非接触影响层检测传感器的机床。 机床包括非接触影响层检测传感器,主体,探针,并且接触工件的表面,由主体支撑的臂部分和尺寸测量传感器,其输出对应于主体的尺寸的信号 基于臂部相对于主体的位移的工件。 受影响层检测传感器设置在臂部,并且输出与工件的受影响状态对应的信号。 臂部分别保持探针,并且可以根据工件的尺寸相对于主体移动。
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公开(公告)号:US09599445B2
公开(公告)日:2017-03-21
申请号:US14676067
申请日:2015-04-01
申请人: JTEKT CORPORATION
发明人: Ryo Ito , Naomasa Mukaide
CPC分类号: G01B5/016 , B23Q17/20 , B23Q17/248 , B24B5/04 , B24B49/105 , G01N27/90
摘要: A machine tool including a non-contact affected layer detection sensor capable of detecting an affected layer with high precision is provided. A machine tool includes a non-contact affected layer detection sensor, a main body, probes and that contact the surface of an workpiece, arm portions supported by the main body, and dimension measurement sensors that output a signal that corresponds to the dimension of the workpiece on the basis of displacement of the arm portions with respect to the main body. The affected layer detection sensor is provided in the arm portion, and outputs a signal that corresponds to an affected state of the workpiece. The arm portions hold the probes respectively, and are displaceable with respect to the main body in accordance with the dimension of the workpiece.
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