专利检索 ap:("Jeffrey S. Beasley" OR "Hema Ramamurthy" OR "Jaime Ramirez-Angulo" OR "Mark R. DeYong") AND inv:"Jaime Ramirez-Angulo" 第 1 页

1.

发明授权
Integrated circuit fault testing implementing voltage supply rail pulsing and corresponding instantaneous current response analysis 失效
标题翻译：集成电路故障测试实现电源电压脉冲和相应的瞬时电流响应分析

公开(公告)号：US5483170A

公开(公告)日：1996-01-09

申请号：US110868

申请日：1993-08-24

申请人： Jeffrey S. Beasley , Hema Ramamurthy , Jaime Ramirez-Angulo , Mark R. DeYong

发明人： Jeffrey S. Beasley , Hema Ramamurthy , Jaime Ramirez-Angulo , Mark R. DeYong

IPC分类号： G01R31/30 , G01R31/00

CPC分类号： G01R31/3004

摘要： A method and apparatus for detecting faults in digital, analog, and hybrid integrated circuits is disclosed. A single test vector employing bias voltage on input used in conjunction with pulsing the power supply rails is used to allow detection of the various faults which may be present. The instantaneous rail current (i.sub.DD) is then employed for analysis of the circuit, preferably by neural network.

摘要翻译： 公开了一种用于检测数字，模拟和混合集成电路中的故障的方法和装置。使用与脉冲电源轨一起使用的输入上使用偏置电压的单个测试矢量来允许检测可能存在的各种故障。然后，优选通过神经网络将瞬时轨道电流（iDD）用于电路的分析。

2.

发明授权
Digitally-configurable analog VLSI chip and method for real-time solution of partial differential equations 失效
标题翻译：数字配置的模拟VLSI芯片和方法用于实时解的偏微分方程

公开(公告)号：US6141676A

公开(公告)日：2000-10-31

申请号：US120986

申请日：1998-07-22

申请人： Jaime Ramirez-Angulo , Mark R. DeYong

发明人： Jaime Ramirez-Angulo , Mark R. DeYong

IPC分类号： G06G7/40 , G06J1/02 , G06G7/38 , G06G7/32 , G06J1/00

CPC分类号： G06G7/40 , G06J1/02

摘要： A programmable Very Large Scale Integration (VLSI) chip and method for the analog solution of a family of partial differential equations commonly encountered in engineering and scientific computing: The Laplace equation, the diffusion or conduction equation, the wave equation, the Poission equation, the modified diffusion equation, the modified wave equation, and the wave equation with damping.

摘要翻译： 用于工程和科学计算中常见的偏微分方程族的模拟解决方案的可编程超大规模集成（VLSI）芯片和方法：拉普拉斯方程，扩散或传导方程，波动方程，Poission方程，改进的扩散方程，修正波方程和具有阻尼的波动方程。