公开(公告)号：US06894503B2

公开(公告)日：2005-05-17

申请号：US10636333

申请日：2003-08-07

申请人： Jiang Shi ,  Jiang Yu ,  Agapito Benavides, III

发明人： Jiang Shi ,  Jiang Yu ,  Agapito Benavides, III

IPC分类号： G01R31/30 ,  G01R31/26

CPC分类号： G01R31/3008

摘要： A method for testing a semiconductor device is included where sleep mode commands associated with the semiconductor device are generated. The semiconductor device includes logic blocks, where a sleep mode command sets a logic block in a sleep mode. A sleep mode sequence associated with the logic blocks of the semiconductor device is determined. The sleep mode commands are executed according to the sleep mode sequence by applying the sleep mode commands to the logic blocks. A quiescent current corresponding to the semiconductor device is measured in order to test the semiconductor device.

摘要翻译： 包括用于测试半导体器件的方法，其中产生与半导体器件相关联的睡眠模式命令。 半导体器件包括逻辑块，其中休眠模式命令在睡眠模式下设置逻辑块。 确定与半导体器件的逻辑块相关联的睡眠模式序列。 通过将睡眠模式命令应用于逻辑块，根据睡眠模式顺序执行睡眠模式命令。 测量对应于半导体器件的静态电流，以便测试半导体器件。