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17 条记录 (耗时 0.187 秒)

    GOLF CLUB IRON SET PRODUCING FLIGHT HAVING CONSISTENT ANGLE OF DESCENT
    5.
    发明申请
    GOLF CLUB IRON SET PRODUCING FLIGHT HAVING CONSISTENT ANGLE OF DESCENT 审中-公开
    高尔夫俱乐部钢铁集团生产具有一致性角度的飞机

    公开(公告)号：US20140073447A1

    公开(公告)日：2014-03-13

    申请号：US13608102

    申请日：2012-09-10

    申请人： Charles E. Golden ,  Jeffrey A. Harmet ,  Daniel Stone ,  Richard M. Nelson

    发明人： Charles E. Golden ,  Jeffrey A. Harmet ,  Daniel Stone ,  Richard M. Nelson

    IPC分类号： A63B53/04

    CPC分类号： A63B53/047 ,  A63B2053/005 ,  A63B2053/0408

    摘要： In accordance with the present invention, a set of golf club heads is disclosed. The set includes golf club heads with peripheral weights. The dimensions and configuration of at least the peripheral weights are changed from club-to-club along the set so that the center of gravity rises from the long irons to the short irons. By raising the center of gravity from the long irons to the short irons, a golfer will see a peak trajectory height along a line for each club head that is substantially more consistent along that line throughout the set than prior art clubs provide.

    摘要翻译： 根据本发明，公开了一组高尔夫球杆头。 该组包括具有外围重量的高尔夫球杆头。 至少周边重量的尺寸和结构从球杆到球杆沿着该组改变，使得重心从长的铁杆上升到短的铁杆。 通过将长的铁杆的重心提升到较短的铁杆，高尔夫球手将看到每个球杆头的线的高峰轨迹高度，与现有技术俱乐部提供的整个线条相比，整个组中的线条基本上更一致。

    Semiconductor analysis arrangement and method therefor
    10.
    发明授权
    Semiconductor analysis arrangement and method therefor 有权
    半导体分析安排及其方法

    公开(公告)号：US06635839B1

    公开(公告)日：2003-10-21

    申请号：US09838672

    申请日：2001-04-19

    申请人： Glen P. Gilfeather ,  Srikar V. Chunduri ,  Brennan V. Davis ,  David H. Eppes ,  Victoria Bruce ,  Michael Bruce ,  Rosalinda M. Ring ,  Daniel Stone

    发明人： Glen P. Gilfeather ,  Srikar V. Chunduri ,  Brennan V. Davis ,  David H. Eppes ,  Victoria Bruce ,  Michael Bruce ,  Rosalinda M. Ring ,  Daniel Stone

    IPC分类号： B07C500

    CPC分类号： G01N21/9501 ,  G01R31/311

    摘要： Semiconductor die analysis is enhanced using a system that is adapted to perturb a die in a test chamber and to detect a response from the die to the perturbation. According to an example embodiment of the present invention, a semiconductor die analysis system includes a test chamber and a docking arrangement adapted to dock with the test chamber. A die is held in the docking arrangement and is presented inside of the test chamber when the docking arrangement is docked with the chamber. Two or more perturbation devices are used to perturb the die, and controller is adapted to control the perturbation. A data acquisition arrangement receives data from the die in response to the perturbation, and the data is used for analyzing the die.

    摘要翻译： 使用适于扰动测试室中的管芯并检测从管芯到扰动的响应的系统来增强半导体管芯分析。 根据本发明的示例性实施例，半导体管芯分析系统包括测试室和适于与测试室对接的对接装置。 模具保持在对接装置中，并且当对接装置与腔室对接时，将模具放置在测试室的内部。 使用两个或更多个扰动装置扰乱管芯，并且控制器适于控制扰动。 数据采集​​装置响应于扰动从管芯接收数据，并且数据用于分析管芯。