METHOD OF FABRICATING SEMICONDUCTOR DEVICE
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    发明申请
    METHOD OF FABRICATING SEMICONDUCTOR DEVICE 审中-公开
    制造半导体器件的方法

    公开(公告)号:US20160336327A1

    公开(公告)日:2016-11-17

    申请号:US15093033

    申请日:2016-04-07

    IPC分类号: H01L27/108 H01L21/66

    摘要: A method of fabricating a semiconductor device includes providing a substrate including a pair of first regions and a second region therebetween, forming first patterns on the respective first regions to at least partially define a stepwise portion at the second region, and forming a dummy pattern that at least partially fills the stepwise portion. The dummy pattern may be an electrically floating structure. The dummy pattern may be formed as part of forming second patterns on the respective first regions, and the dummy pattern and the second patterns may include substantially common materials. Because the dummy pattern at least partially fills the stepwise portion at the second region, the material layer covering the second patterns and the dummy pattern may omit a corresponding stepwise portion.

    摘要翻译: 制造半导体器件的方法包括提供包括一对第一区域和其间的第二区域的衬底,在相应的第一区域上形成第一图案以至少部分地限定第二区域的阶梯部分,并且形成虚设图案, 至少部分地填充逐步部分。 虚拟图案可以是电浮置结构。 伪图案可以形成为在相应的第一区域上形成第二图案的一部分,并且虚设图案和第二图案可以包括基本上共同的材料。 由于虚拟图案至少部分地填充第二区域的逐步部分,所以覆盖第二图案和虚设图案的材料层可以省略相应的逐步部分。