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1.发明授权
公开(公告)号：US5936242A
公开(公告)日：1999-08-10
申请号：US138981
申请日：1998-08-24
CPC分类号： G01N15/0266 , H01J49/04
摘要： An analytical apparatus provides for the separation and analysis of a subset of ions from a mixture of ions in a gas. The apparatus includes an ion supply, such as an electrospray, which provides a population of variously charged ions. An analyzing chamber is coupled to the ion supply and includes a first wall with an inlet orifice for receiving the flow of variously charged ions, and a second wall opposed to the first wall. A laminar gas flow is established within the analyzing chamber along a flow axis. The second wall is provided with an outlet orifice that is displaced by a determined distance along the gas flow axis from the inlet orifice. A potential difference is applied between the first and second walls which causes the flow of ions, introduced via the inlet orifice, to migrate towards the outlet orifice. The laminar gas flow displaces ion flight trajectories along the flow axis, so that only the ions with a mobility near a specific value reach the second wall close enough to the outlet orifice to be sampled through it. The outlet orifice is coupled to the inlet of a mass spectrometer to enable analysis of the ions emerging from the outlet orifice.
摘要翻译： 分析装置提供从气体中的离子混合物分离和分析离子子集。 该装置包括提供多种不同电荷的离子的离子供应，例如电喷雾。 分析室耦合到离子供应并且包括具有用于接收各种带电离子的流的入口孔的第一壁和与第一壁相对的第二壁。 在分析室内沿流动轴线建立层流气流。 第二壁设置有出口孔口，其沿着气体流动轴线从入口孔口移动确定的距离。 在第一和第二壁之间施加电位差，其导致通过入口孔引入的离子流向出口孔迁移。 层流气流沿流动轴移动离子飞行轨迹，使得仅具有接近特定值的迁移率的离子到达足够靠近出口孔的第二壁以通过其采样。 出口孔连接到质谱仪的入口，以便分析从出口孔排出的离子。
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公开(公告)号：US5869831A
公开(公告)日：1999-02-09
申请号：US881060
申请日：1997-06-24
IPC分类号： H01J49/04
CPC分类号： G01N15/0266 , H01J49/04
摘要： An analytical apparatus provides for the separation and analysis of a subset of ions from a mixture of ions in a gas. The apparatus includes an ion supply, such as an electrospray, which provides a population of variously charged ions. An analyzing chamber is coupled to the ion supply and includes a first wall with an inlet orifice for receiving the flow of variously charged ions, and a second wall opposed to the first wall. A laminar gas flow is established within the analyzing chamber along a flow axis. The second wall is provided with an outlet orifice that is displaced by a determined distance along the gas flow axis from the inlet orifice. A potential difference is applied between the first and second walls which causes the flow of ions, introduced via the inlet orifice, to migrate towards the outlet orifice. The laminar gas flow displaces ion flight trajectories along the flow axis, so that only the ions with a mobility near a specific value reach the second wall close enough to the outlet orifice to be sampled through it. The outlet orifice is coupled to the inlet of a mass spectrometer to enable analysis of the ions emerging from the outlet orifice.
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