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1.发明授权公开(公告)号：US10458954B2
公开(公告)日：2019-10-29
申请号：US15454182
申请日：2017-03-09
发明人： Sanae Iida , Takashi Usui
摘要： According to an embodiment, a structure evaluation system has a plurality of sensors, a signal processor, and an evaluator. The sensors detect an elastic wave generated from a structure. The signal processor acquires a reliability from a source of the elastic wave to the plurality of sensors by performing signal processing on the elastic wave detected by the plurality of sensors. The evaluator evaluates the soundness of the structure on the basis of the acquired reliability.
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2.发明授权公开(公告)号：US11519883B2
公开(公告)日：2022-12-06
申请号：US17012604
申请日：2020-09-04
发明人： Sanae Iida , Takashi Usui
摘要： According to one embodiment, a structure evaluation system of the embodiments includes a plurality of sensors, an arrival time determiner, a reliability calculator, and a map generator. The plurality of sensors detect elastic waves. The arrival time determiner determines arrival times of the elastic waves using elastic waves detected by the plurality of respective sensors. The reliability calculator calculates reliabilities related to measurement waveforms of the elastic waves on the basis of the arrival times. The map generator generates a first map on the basis of the calculated reliabilities or the reliabilities and a distance.
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3.发明授权公开(公告)号：US10352912B2
公开(公告)日：2019-07-16
申请号：US15455976
申请日：2017-03-10
发明人： Sanae Iida , Takashi Usui
摘要： According to an embodiment, a structure evaluation system has a plurality of sensors, a signal processor, and an evaluator. The sensors detect an elastic wave generated from a structure. The signal processor acquires a reliability from a source of the elastic wave to the plurality of sensors by performing signal processing on the elastic wave detected by the plurality of sensors. The evaluator evaluates the soundness of the structure on the basis of the acquired reliability.
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