公开(公告)号：US20220152830A1

公开(公告)日：2022-05-19

申请号：US17525960

申请日：2021-11-15

Applicant: KABUSHIKI KAISHA YASKAWA DENKI

Inventor： Ryo KABUTAN ,  Takuro MATSUMOTO ,  Ryohei SUZUKI

IPC: B25J9/16 ,  G01M99/00 ,  B23K37/02

Abstract: An example diagnosis system determines a state of a target device that includes a work apparatus. The diagnosis system includes circuitry that is configured to acquire first data generated in response to operating the work apparatus at a first pressure, configured to acquire second data generated in response to operating the work apparatus at a second pressure, configured to calculate a feature quantity indicating a relation between the first data and the second data, and configured to determine the state of the target device based on the feature quantity.

公开(公告)号：US20220266395A1

公开(公告)日：2022-08-25

申请号：US17668382

申请日：2022-02-10

Applicant: KABUSHIKI KAISHA YASKAWA DENKI

Inventor： Masafumi MURAKAMI ,  Fuminori INAGAKI ,  Takuro MATSUMOTO ,  Tomoko TAKASU

IPC: B23K31/12 ,  B23K9/095

Abstract: A welding system includes a welder configured to weld a workpiece at welding points on the workpiece, data acquisition circuitry configured to acquire welding data indicating welding quality at the welding points, and quality evaluation circuitry configured to evaluate the welding quality at each of the welding points based on the welding data according to a determination algorithm which is associated with each of the welding points.