公开(公告)号：US20170285070A1

公开(公告)日：2017-10-05

申请号：US15476679

申请日：2017-03-31

申请人： KEITHLEY INSTRUMENTS, LLC

发明人： GREGORY SOBOLEWSKI ,  MICHAEL D. RAYMAN ,  NATHAN A. SCHATT

IPC分类号： G01R1/44 ,  G01R15/12 ,  G01R13/22

CPC分类号： G01R1/44 ,  G01R1/30 ,  G01R15/125

摘要： An electronic test measurement system can include a device under test (DUT) and an electronic test instrument that includes a signal input configured to receive an electrical signal from the DUT, a cooling mechanism, and a processor. The processor can be configured to determine a frequency at which the cooling mechanism should operate, cause the cooling mechanism to operate at the determined frequency, select a filter based on the determined frequency, and apply the filter to the electrical signal to reduce interference with the electrical signal resulting from mechanical vibrations of the cooling mechanism.