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公开(公告)号:US10724964B1
公开(公告)日:2020-07-28
申请号:US16379900
申请日:2019-04-10
Applicant: KLA-TENCOR CORPORATION
Inventor: Pablo Pombo , Kurt Lehman
Abstract: Sensor units can be disposed in a support member. Each of the sensor units can include a folded flex board having a plurality of laminations and an aperture and a sensor disposed in the folded flex board such that the sensor is positioned over the aperture. The system can be used in broad band plasma inspection tools for semiconductor wafers.