Using stochastic failure metrics in semiconductor manufacturing

    公开(公告)号:US10818001B2

    公开(公告)日:2020-10-27

    申请号:US16241467

    申请日:2019-01-07

    Abstract: A stochastic calculation engine receives inputs from a semiconductor inspection tool or semiconductor review tool. The stochastic calculation engine determines abnormal locations and pattern variation from the inputs and determines stochastic failures from the inputs. An electronic data storage unit connected with the stochastic calculation engine can include a database with known stochastic behavior and known process metrology variations. The stochastic calculation engine can flag stochastic features, determine a failure rate, or determine fail probability.

    USING STOCHASTIC FAILURE METRICS IN SEMICONDUCTOR MANUFACTURING

    公开(公告)号:US20200082523A1

    公开(公告)日:2020-03-12

    申请号:US16241467

    申请日:2019-01-07

    Abstract: A stochastic calculation engine receives inputs from a semiconductor inspection tool or semiconductor review tool. The stochastic calculation engine determines abnormal locations and pattern variation from the inputs and determines stochastic failures from the inputs. An electronic data storage unit connected with the stochastic calculation engine can include a database with known stochastic behavior and known process metrology variations. The stochastic calculation engine can flag stochastic features, determine a failure rate, or determine fail probability.

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