公开(公告)号：US20240282405A1

公开(公告)日：2024-08-22

申请号：US18567367

申请日：2022-06-23

Applicant: KONICA MINOLTA, INC.

Inventor： Ken OKAMOTO ,  Takatoshi SUEMATSU ,  Wataru ONODA ,  Atsuro TATSUMI ,  Yuichiro ASAI ,  Naoko FURUSAWA

IPC: G16B15/20 ,  G01N27/414 ,  G16B40/10

CPC classification number: G16B15/20 ,  G01N27/414 ,  G16B40/10

Abstract: An analysis system, a learned model generation device, a discrimination system, an analysis method, a learned model generation method, and a discrimination method can sensitively quantify at least one of an aggregation state or a surface state. An analysis system includes an acquisition unit for acquiring a signal change over time due to interaction between a capture target substance and a capture substance by an electrical detection method or optical detection method, and an analysis unit for analyzing at least one of an aggregation state and a surface state of the capture target substance from the signal change over time acquired by the acquisition unit.