公开(公告)号：US20140355740A1

公开(公告)日：2014-12-04

申请号：US14370301

申请日：2012-12-26

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Thomas Koehiler ,  Ewald Roessl

IPC: A61B6/00

CPC classification number: A61B6/484 ,  A61B6/482

Abstract: In generating phase image data 38 first x-ray image data 28a comprising first pixel-wise measurement signal values 30a and second x-ray image data 28b comprising second pixel-wise measurement signal values 30b are received. The first x-ray image data 28a was obtained in a first measurement mode and the second x-ray image data 28b was obtained in a second measurement mode different from the first measurement mode. Phase image data 38 comprising pixel-wise phase values 34 from the first and second x-ray image data 28a, 28b is determined by determining a phase value 34 at a pixel 31 from a first measurement signal value 30a obtained in a first measurement mode at the pixel 31 and a second measurement signal value 30b obtained in a second measurement mode at the pixel 31.

Abstract translation: 在生成相位图像数据38中，接收包括第一像素测量信号值30a和包括第二像素测量信号值30b的第二x射线图像数据28b的第一x射线图像数据28a。 在第一测量模式下获得第一X射线图像数据28a，并且以与第一测量模式不同的第二测量模式获得第二X射线图像数据28b。 通过从在第一测量模式中获得的第一测量信号值30a确定像素31处的相位值34来确定包括来自第一和第二X射线图像数据28a，28b的像素相位值34的相位图像数据38 像素31和在像素31处以第二测量模式获得的第二测量信号值30b。