公开(公告)号：US11728125B2

公开(公告)日：2023-08-15

申请号：US17126904

申请日：2020-12-18

Applicant: KOREA ATOMIC ENERGY RESEARCH INSTITUTE

Inventor： Young Uk Jeong ,  Nikolay Vinokurov ,  Hyun Woo Kim ,  Ki Tae Lee ,  Kyuha Jang ,  Inhyung Baek

IPC: H01J37/14 ,  H01J37/073

CPC classification number: H01J37/14 ,  H01J37/073

Abstract: There is provided an ultrafast electron diffraction apparatus including: a photoelectron gun configured to emit an electron beam; a bending portion for emitting the electron beam emitted from the photoelectron gun by changing a travel direction of the electron beam by a predetermined angle; and a sample portion including a sample to be analyzed by the electron beam emitted from the bending portion. The electron beam reaches the sample portion in a state that a pulse of the electron beam is compressed and the timing jitter between the pumping light and probe electron pulse is completely reduced as the travel direction of the electron beam is changed by the predetermined angle through the bending portion.