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公开(公告)号:US11512397B2
公开(公告)日:2022-11-29
申请号:US17132560
申请日:2020-12-23
发明人: Ryou Kouno , Takuo Ohwada
IPC分类号: C23F1/26 , H01L21/3213 , H01L21/308 , H01L21/768
摘要: An etchant composition that is capable of batch etching treatment of a tungsten film and a titanium nitride film and a method for etching using said etchant composition are provided. The etching composition of the present invention is an etchant composition comprising nitric acid and water for batch etching treatment of a tungsten film and a titanium nitride film.
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公开(公告)号:US20190301026A1
公开(公告)日:2019-10-03
申请号:US16316054
申请日:2017-07-07
发明人: Ryou Kouno , Takuo Ohwada
IPC分类号: C23F1/26 , H01L21/3213
摘要: An etchant composition that is capable of batch etching treatment of a tungsten film and a titanium nitride film and a method for etching using said etchant composition are provided.The etching composition of the present invention is an etchant composition comprising nitric acid and water for batch etching treatment of a tungsten film and a titanium nitride film.
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