公开(公告)号：US4178084A

公开(公告)日：1979-12-11

申请号：US869447

申请日：1978-01-16

申请人： Kazuya Matsumoto ,  Susumu Matsumura ,  Aiichiro Koyama ,  Youichi Okuno ,  Tokuichi Tsunlkawa ,  Tadashi Ito

发明人： Kazuya Matsumoto ,  Susumu Matsumura ,  Aiichiro Koyama ,  Youichi Okuno ,  Tokuichi Tsunlkawa ,  Tadashi Ito

IPC分类号： G02B5/32 ,  G03B7/099 ,  G03B7/00 ,  G03B19/12

CPC分类号： G02B5/32 ,  G03B7/09976

摘要： The present invention relates to a device for measuring light incident on an image-forming optical system, making use of a plural number of diffraction elements. The plural number of the diffraction elements are respectively provided in the optical path of the image-forming optical system. Further the plural number of the diffraction elements respectively have a certain predetermined area. The plural number of the diffraction elements, seen along the direction of the optical axis of the image-forming optical system, are substantially only partially overlapped with respect to each other. The light beam incident on a diffraction element is divided into a non-diffracted light beam and a diffracted light beam. Thus, the diffracted light beam is directed toward the light detecting means so as to be measured while the non-diffracted light beam advances along the above mentioned optical axis. Consequently, at the part at which the diffraction elements overlap each other, the non-diffracted light beam emerging from the preceeding diffraction element again enters the following diffraction element. This light beam is again divided into a non-diffracted light beam and a diffracted light beam by means of the following diffraction element. The diffracted light beam is measured by a light detecting means in the same way as in the above mentioned case, while the non-diffracted light beam advances along the above mentioned optical axis. Thus, the light beam which passes through the overlapping parts is measured a plural number of times.

摘要翻译： 本发明涉及一种利用多个衍射元件测量入射在图像形成光学系统上的光的装置。 多个衍射元件分别设置在成像光学系统的光路中。 此外，多个衍射元件分别具有一定的预定面积。 沿着图像形成光学系统的光轴的方向看到的多个衍射元件相对于彼此基本上仅部分重叠。 入射到衍射元件上的光束被分成非衍射光束和衍射光束。 因此，衍射光束被引导到光检测装置，以便当非衍射光束沿着上述光轴前进时被测量。 因此，在衍射元件彼此重叠的部分，从前面的衍射元件出射的非衍射光束再次进入随后的衍射元件。 该光束通过以下衍射元件再分为非衍射光束和衍射光束。 衍射光束以与上述情况相同的方式由光检测装置测量，而非衍射光束沿着上述光轴前进。 因此，通过重叠部分的光束被测量多次。