公开(公告)号：US12299870B2

公开(公告)日：2025-05-13

申请号：US17686468

申请日：2022-03-04

Applicant: Keyence Corporation

Inventor： Yuichiro Hama ,  Keisuke Fukuta ,  Nobuyuki Kurihara

IPC: G06T7/00 ,  G06T7/90 ,  G06V10/46 ,  G06V10/56 ,  H04N7/18 ,  H04N23/56 ,  H04N23/72

Abstract: The image inspection apparatus includes an image score calculator and an imaging condition specifier. The image score calculator calculates scores of images, which are produced under different imaging conditions. The imaging condition specifier receives, when two or more thumbnails corresponding to two or more of the images that have a higher score are displayed on the display, selection of one from the two or more thumbnails to specify a set of imaging conditions corresponding to the thumbnail selected. The different imaging conditions include a single-shot set of conditions under which a single-shot image is produced, and a composition series of sets of conditions under which images are captured to produce a composite image from the images. The display shows a reference information display area that indicates reference information representing the single-shot set or composition series of sets in response to the displaying of the two or more thumbnails.

公开(公告)号：US11042977B2

公开(公告)日：2021-06-22

申请号：US16729531

申请日：2019-12-30

Applicant: Keyence Corporation

Inventor： Nobuyuki Kurihara ,  Shunichi Hino

IPC: G06T7/00

Abstract: To enable inspection setting flows appropriate for a rule-based inspection mode and a learning-based inspection mode to be easily created when these modes are implemented in an image inspection apparatus. The rule-based inspection mode and the learning-based inspection mode are implemented in the image inspection apparatus. In the setting mode in a rule-based inspection, the user can set an imaging condition, select an image processing tool, set the application range of an image processing tool, and adjust the parameters of the image processing tool. In the setting mode in a learning-based inspection, a non-defective product image and a defective product image are input to generate a distinguishing device.