Displacement measuring apparatus
    1.
    发明授权

    公开(公告)号:US10859369B2

    公开(公告)日:2020-12-08

    申请号:US16601606

    申请日:2019-10-15

    Abstract: To enable scanning using measurement light with a small-sized displacement measuring apparatus. The displacement measuring apparatus includes a MEMS mirror for scanning using measurement light that is output from a light projection lens. The light projection lens has a focus position, at which the measurement light is condensed, at the MEMS mirror or in the vicinity of the MEMS mirror on an optical axis of the measurement light. The measurement light that is reflected at the MEMS mirror spreads in a strip-shaped manner as the measurement light comes close to a measurement region.

    Image inspection apparatus and image inspection method

    公开(公告)号:US12299870B2

    公开(公告)日:2025-05-13

    申请号:US17686468

    申请日:2022-03-04

    Abstract: The image inspection apparatus includes an image score calculator and an imaging condition specifier. The image score calculator calculates scores of images, which are produced under different imaging conditions. The imaging condition specifier receives, when two or more thumbnails corresponding to two or more of the images that have a higher score are displayed on the display, selection of one from the two or more thumbnails to specify a set of imaging conditions corresponding to the thumbnail selected. The different imaging conditions include a single-shot set of conditions under which a single-shot image is produced, and a composition series of sets of conditions under which images are captured to produce a composite image from the images. The display shows a reference information display area that indicates reference information representing the single-shot set or composition series of sets in response to the displaying of the two or more thumbnails.

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