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公开(公告)号:US20200074663A1
公开(公告)日:2020-03-05
申请号:US16527078
申请日:2019-07-31
Applicant: Keyence Corporation
Inventor: Tadashi HASHIMOTO , Takashi NARUSE , Kengo YANASE
Abstract: The image measurement apparatus searches for a workpiece by performing a first stage operation. The image measurement apparatus generates an image in each imaging field-of-view while moving the stage according to a predetermined sequence, and determines whether or not the workpiece is included in each image. When the workpiece is found, the image measurement apparatus switches from the first stage operation to a second stage operation. The image measurement apparatus generates an image in one or more imaging field-of-views located in a direction in which the workpiece extends, among a plurality of imaging field-of-views located around the imaging field-of-view on the stage, in which the image has been obtained. The image measurement apparatus joins a plurality of images generated in the second stage operation to generate a joined image including the whole workpiece, and displays the joined image.
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公开(公告)号:US20230368362A1
公开(公告)日:2023-11-16
申请号:US18122751
申请日:2023-03-17
Applicant: Keyence Corporation
Inventor: Takashi NARUSE
CPC classification number: G06T7/0006 , G06T7/74 , G06T7/13 , G06T7/60 , G06T2207/30164 , G06T2200/24
Abstract: A first contact target position, a second contact target position, and a characteristic pattern for specifying a position and a posture of the workpiece are set in association with each other. First and second contact target positions for measurement are specified from a workpiece image newly generated during the execution of measurement such that a driving section is controlled to bring the touch probe into contact with the side surface of the workpiece with the specified first contact target position for measurement as a reference, and the driving section is controlled to bring the touch probe into contact with the upper surface of the workpiece with the specified second contact target position for measurement as a reference. Three-dimensional coordinates of a contact point are measured based on a contact signal output when the touch probe comes into contact with the workpiece.
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公开(公告)号:US20250035422A1
公开(公告)日:2025-01-30
申请号:US18912643
申请日:2024-10-11
Applicant: Keyence Corporation
Inventor: Takashi NARUSE
Abstract: A first contact target position, a second contact target position, and a characteristic pattern for specifying a position and a posture of the workpiece are set in association with each other. First and second contact target positions for measurement are specified from a workpiece image newly generated during the execution of measurement such that a driving section is controlled to bring the touch probe into contact with the side surface of the workpiece with the specified first contact target position for measurement as a reference, and the driving section is controlled to bring the touch probe into contact with the upper surface of the workpiece with the specified second contact target position for measurement as a reference. Three-dimensional coordinates of a contact point are measured based on a contact signal output when the touch probe comes into contact with the workpiece.
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公开(公告)号:US20230368363A1
公开(公告)日:2023-11-16
申请号:US18122752
申请日:2023-03-17
Applicant: Keyence Corporation
Inventor: Takashi NARUSE
CPC classification number: G06T7/0006 , G06T7/74 , G06T7/60 , G06T7/13 , G06T2207/30164 , G06T2200/24
Abstract: An image measurement apparatus includes: a setting section which sets a measurement element having a geometric shape; a storage section which stores in advance a correspondence relationship between a shape type or a size of the measurement element settable by the setting section, and positions and the number of contact target positions of the touch probe to be arranged with respect to the measurement element; and a control section which specifies a plurality of contact target positions of the touch probe based on a position of the measurement element on the workpiece image set by the setting section, the shape type or size of the measurement element, and the correspondence relationship stored in advance during the measurement execution by the touch probe, and relatively moves a stage or the touch probe to move the touch probe sequentially to the plurality of specified contact target positions.
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